Single-reflection attenuated total reflection of organic monolayers on silicon

被引：28
作者：
Milosevic, M
Berets, SL
Fadeev, AY
机构：
[1] Harrick Sci Corp, Ossining, NY 10562 USA
[2] Seton Hall Univ, Dept Chem & Biochem, S Orange, NJ 07079 USA
来源：
APPLIED SPECTROSCOPY | 2003年 / 57卷 / 06期
关键词：
attenuated total reflection; ATR; internal reflection; Fourier transform infrared spectroscopy; FT-IR; spectroscopy; monolayers; thin films; grazing angle spectroscopy; silicon substrates;
D O I：
10.1366/000370203322005454
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：724 / 727
页数：4
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