Angle-resolved electron-electron and electron-ion coincidence spectroscopy: new tools for photoionization studies

被引：22
|
作者：
Becker, U [1 ]
机构：
[1] Max Planck Gesell, Fritz Haber Inst, D-14195 Berlin, Germany
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2000年 / 112卷 / 1-3期
关键词：
D O I：
10.1016/S0368-2048(00)00202-4
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The development of two new experimental methods in gas phase photoionization studies is reviewed. These are angle-resolved electron-electron coincidence spectroscopy and angle-resolved electron-fragment ion coincidence spectroscopy. The review concentrates on systems which employ time-of-flight techniques for both the electron and ion detections. In addition to a technical description of such a system for both methods, showcase examples of their application in synchrotron radiation-based atomic and molecular physics are presented and discussed. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：47 / 65
页数：19
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