IN-SITU X-RAY REFLECTIVITY MEASUREMENT OF THIN FILM GROWTH

被引：0
|
作者：
Lee, Chih-Hao [1 ]
Tseng, Sung-Yuh [1 ]
机构：
[1] Natl Tsing Hua Univ, Dept Nucl Engn & Engn Phys, Hsinchu 30043, Taiwan
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1996年 / 52卷
关键词：
D O I：
10.1107/S0108767396080609
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
PS12.03.09
引用
收藏
页码：C473 / C473
页数：1
相关论文
共 50 条
  • [41] Fixed-angle, energy-dispersive x-ray reflectivity measurement of thin tantalum film thickness
    D. Windover
    E. Barnat
    J. Summers
    T. -M. Lu
    A. Kumar
    H. Bakhru
    S. L. Lee
    Journal of Electronic Materials, 2002, 31 : 848 - 856
  • [42] In-situ X-ray reflectivity study of alkane films grown from the vapor phase
    Basu, S.
    Satija, S. K.
    LANGMUIR, 2007, 23 (16) : 8331 - 8335
  • [43] X-ray diffraction and X-ray reflectivity applied to investigation of thin films
    Rafaja, D
    ADVANCES IN SOLID STATE PHYSICS 41, 2001, 41 : 275 - 286
  • [44] Kinetic stabilization of Fe film on GaAs(100):: An in situ X-ray reflectivity study
    Noh, D. Y.
    Kim, T. C.
    Kim, Y.
    Lee, J. -M.
    Oh, S. -J.
    Kim, J. -S.
    SURFACE SCIENCE, 2007, 601 (23) : 5555 - 5558
  • [45] In Situ Real-Time X-Ray Diffraction During Thin Film Growth of Pentacene
    Watanabe, T.
    Hosokai, T.
    Koganezawa, T.
    Yoshimoto, N.
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 2012, 566 : 18 - 21
  • [46] In-situ X-ray crystallite growth study on nanocrystalline Fe
    Natter, H
    Schmelzer, M
    Löffler, MS
    Hempelmann, R
    METASTABLE, MECHANICALLY ALLOYED AND NANOCRYSTALLINE MATERIALS, PTS 1 AND 2, 2000, 343-3 : 683 - 688
  • [47] In-situ X-ray topography on crystal growth of silicon carbide
    2001, Japan Welding Society (70):
  • [48] Measurement of thin film elastic constants by X-ray diffraction
    Faurie, D
    Renault, PO
    Le Bourhis, E
    Villain, P
    Goudeau, P
    Badawi, F
    THIN SOLID FILMS, 2004, 469 : 201 - 205
  • [49] Observing hydrogen intercalation into palladium thin films using in situ grazing incidence x-ray diffraction and x-ray reflectivity
    Landers, Alan
    Feaster, Jeremy
    Brown, Kris
    Lin, John
    Farmand, Maryam
    Fackler, Sean
    Nishimura, Yusaku
    Beeman, Jeffrey
    Bajdich, Michal
    Higgins, Drew
    Yano, Junko
    Drisdell, Walter
    Davis, Ryan
    Hahn, Christopher
    Mehta, Apurva
    Jaramillo, Thomas
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2019, 257
  • [50] Structure and growth of stearate monolayers on the calcite(104) surface: First results of an in-situ X-ray reflectivity study.
    Sturchio, NC
    Fenter, P
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1999, 217 : U833 - U833
12345