The future of atom probe tomography

被引:68
|
作者
Miller, Michael K. [1 ]
Kelly, Thomas. F. [2 ]
Rajan, Krishna [3 ]
Ringer, Simon P. [4 ]
机构
[1] Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA
[2] Cameca Instruments Inc, Madison, WI 53711 USA
[3] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA
[4] Univ Sydney, Australian Ctr Microscopy & Microanal, Sydney, NSW 2006, Australia
基金
美国国家科学基金会; 澳大利亚研究理事会;
关键词
SPECIMEN PREPARATION; RECONSTRUCTION; IMPLEMENTATION; DISLOCATIONS; MICROSCOPY; RESOLUTION;
D O I
10.1016/S1369-7021(12)70069-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
History has taught us that every time a new form of microscopy or type of microscope is introduced, major advances are made in the understanding of materials. For example, the light or optical microscope introduced the world to microbes and micro-organisms around 1600 AD, and the electron microscope to dislocations in materials over 50 years ago(1-3). Today many different forms of microscopy have been developed but the ultimate goal of seeing, accurately locating, and identifying all the atoms in a specimen is still elusive. Atom probe tomography and electron microscopy are the mainstays of atomic resolution microscopy of bulk materials. However, neither technique can accomplish this goal in the bulk of a specimen at the present time.
引用
收藏
页码:158 / 165
页数:8
相关论文
共 50 条
  • [41] Atom Probe Tomography: a Local Probe for Chemical Bonds in Solids
    Cojocaru-Miredin, Oana
    Yu, Yuan
    Koettgen, Jan
    Ghosh, Tanmoy
    Schoen, Carl-Friedrich
    Han, Shuai
    Zhou, Chongjian
    Zhu, Min
    Wuttig, Matthias
    ADVANCED MATERIALS, 2024,
  • [42] Electron diffraction and imaging for atom probe tomography
    Kirchhofer, Rita
    Diercks, David R.
    Gorman, Brian P.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2018, 89 (05):
  • [43] Pragmatic reconstruction methods in atom probe tomography
    Vurpillot, F.
    Gruber, M.
    Da Costa, G.
    Martin, I.
    Renaud, L.
    Bostel, A.
    ULTRAMICROSCOPY, 2011, 111 (08) : 1286 - 1294
  • [44] Quantitative Atom Probe Tomography of Magnesium Alloys
    Oh-ishi, K.
    Ohkubo, T.
    Hono, K.
    MICROSCOPY AND MICROANALYSIS, 2009, 15 : 14 - 15
  • [45] Introduction: Special issue on atom probe tomography
    Ringer, Simon P.
    Larson, David J.
    Moody, Michael P.
    Miller, Michael K.
    Kelly, Thomas F.
    MICROSCOPY AND MICROANALYSIS, 2007, 13 (06) : 407 - 407
  • [46] Atom probe tomography quantification of carbon in silicon
    Dumas, P.
    Duguay, S.
    Borrel, J.
    Hilario, F.
    Blavette, D.
    Ultramicroscopy, 2021, 220
  • [47] Atom probe tomography: A technique for nanoscale characterization
    Miller, MK
    Kenik, EA
    MICROSCOPY AND MICROANALYSIS, 2004, 10 (03) : 336 - 341
  • [48] Spatial distribution maps for atom probe tomography
    Geiser, Brian P.
    Kelly, Thomas F.
    Larson, David J.
    Schneir, Jason
    Roberts, Jay P.
    MICROSCOPY AND MICROANALYSIS, 2007, 13 (06) : 437 - 447
  • [49] Atom Probe Tomography of Zinc Oxide Nanowires
    Dawahre, Nabil
    Shen, Gang
    Balci, Soner
    Baughman, William
    Wilbert, David S.
    Harris, Nick
    Butler, Lee
    Martens, Rich
    Kim, Seongsin Margaret
    Kung, Patrick
    JOURNAL OF ELECTRONIC MATERIALS, 2012, 41 (05) : 801 - 808
  • [50] An Atom Probe Tomography Prototype with Laser Evaporation
    Rogozhkin, S. V.
    Aleev, A. A.
    Lukyanchuk, A. A.
    Shutov, A. S.
    Raznitsyn, O. A.
    Kirillov, S. E.
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2017, 60 (03) : 428 - 433