The future of atom probe tomography

被引：68

作者：

Miller, Michael K. ^{[1
]}

Kelly, Thomas. F. ^{[2
]}

Rajan, Krishna ^{[3
]}

Ringer, Simon P. ^{[4
]}

机构：

[1] Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA

[2] Cameca Instruments Inc, Madison, WI 53711 USA

[3] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA

[4] Univ Sydney, Australian Ctr Microscopy & Microanal, Sydney, NSW 2006, Australia

来源：

MATERIALS TODAY | 2012年 / 15卷 / 04期

基金：

美国国家科学基金会; 澳大利亚研究理事会;

关键词：

SPECIMEN PREPARATION; RECONSTRUCTION; IMPLEMENTATION; DISLOCATIONS; MICROSCOPY; RESOLUTION;

D O I：

10.1016/S1369-7021(12)70069-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

History has taught us that every time a new form of microscopy or type of microscope is introduced, major advances are made in the understanding of materials. For example, the light or optical microscope introduced the world to microbes and micro-organisms around 1600 AD, and the electron microscope to dislocations in materials over 50 years ago(1-3). Today many different forms of microscopy have been developed but the ultimate goal of seeing, accurately locating, and identifying all the atoms in a specimen is still elusive. Atom probe tomography and electron microscopy are the mainstays of atomic resolution microscopy of bulk materials. However, neither technique can accomplish this goal in the bulk of a specimen at the present time.

引用

页码：158 / 165

页数：8

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