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- [3] Convolutional Neural Network for Imbalanced Data Classification of Silicon Wafer Defects 2020 16TH IEEE INTERNATIONAL COLLOQUIUM ON SIGNAL PROCESSING & ITS APPLICATIONS (CSPA 2020), 2020, : 230 - 235
- [6] Deep learning-based classification of eye diseases using Convolutional Neural Network for OCT images FRONTIERS IN COMPUTER SCIENCE, 2024, 5