Thickness measurement of organic films using Compton scattering of characteristic X-rays

被引：13

作者：

Kim, Jong-Yun ^{[1
]}

Choi, Yong Suk ^{[1
]}

Park, Yong Joon ^{[1
]}

Song, Kyuseok ^{[1
]}

Jung, Sung-Hee ^{[2
]}

Hussein, Esam M. A. ^{[3
]}

机构：

[1] Korea Atom Energy Res Inst, Nucl Chem Res Div, Taejon 305353, South Korea

[2] Korea Atom Energy Res Inst, Div Radioisotope R&D, Taejon 305353, South Korea

[3] Univ New Brunswick, Dept Mech Engn, Lab Threat Mat Detect, Fredericton, NB E3B 5A3, Canada

来源：

APPLIED RADIATION AND ISOTOPES | 2011年 / 69卷 / 09期

关键词：

Thickness gauge; Organic films; Compton scattering; Characteristic X-ray; SPECTROMETRY;

D O I：

10.1016/j.apradiso.2011.03.048

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

An X-ray scattering method is presented for determining the thickness of an organic film placed on a steel substrate. The strong peaks of characteristic X-rays are taken as an advantage to measure the intensity of backscattered photons. It is shown that the intensity of Compton scattering of characteristic X-rays is proportional to film thickness, up to the thickness of 250 mu m of acrylic adhesive layers. In addition, the measurement time was 300 ms, providing a simple and convenient method for on-line for thickness monitoring. (C) 2011 Elsevier Ltd. All rights reserved.

引用

页码：1241 / 1245

页数：5

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