Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids

被引：21

作者：

Jaafar, Miriam ^{[1
]}

Martinez-Martin, David ^{[1
]}

Cuenca, Mariano ^{[2
]}

Melcher, John ^{[3
]}

Raman, Arvind ^{[4
,5
]}

Gomez-Herrero, Julio ^{[1
]}

机构：

[1] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain

[2] Univ Autonoma Madrid, Serv Gen Apoyo Invest, E-28049 Madrid, Spain

[3] Univ Bristol, Dept Engn Math, Bristol BS8 1TR, Avon, England

[4] Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47904 USA

[5] Purdue Univ, Sch Mech Engn, W Lafayette, IN 47904 USA

来源：

BEILSTEIN JOURNAL OF NANOTECHNOLOGY | 2012年 / 3卷

关键词：

atomic force microscopy; control systems; dissipation; frequency modulation; noncontact; FREQUENCY; DISSIPATION; CANTILEVERS; SURFACE; SAMPLES; ENERGY;

D O I：

10.3762/bjnano.3.38

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We introduce drive-amplitude-modulation atomic force microscopy as a dynamic mode with outstanding performance in all environments from vacuum to liquids. As with frequency modulation, the new mode follows a feedback scheme with two nested loops: The first keeps the cantilever oscillation amplitude constant by regulating the driving force, and the second uses the driving force as the feedback variable for topography. Additionally, a phase-locked loop can be used as a parallel feedback allowing separation of the conservative and nonconservative interactions. We describe the basis of this mode and present some examples of its performance in three different environments. Drive-amplutide modulation is a very stable, intuitive and easy to use mode that is free of the feedback instability associated with the noncontact-to-contact transition that occurs in the frequency-modulation mode.

引用

页码：336 / 344

页数：9

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