Analytical modelling and device design optimisation of epitaxial layer-based III-V tunnel FET

被引:10
作者
Dubey, Prabhat Kumar [1 ]
Kaushik, Brajesh Kumar [1 ]
Simoen, Eddy [2 ]
机构
[1] IIT Roorkee, Dept Elect & Commun Engn, Roorkee 247667, Uttar Pradesh, India
[2] IMEC, B-3001 Leuven, Belgium
关键词
Poisson equation; III-V semiconductors; semiconductor device models; field effect transistors; surface potential; elemental semiconductors; tunnelling; tunnel transistors; field effect transistor switches; surface potential model; Synopsys technology computer-aided design simulation; device design guideline; analytical modelling; epitaxial layer-based III-V tunnel FET; tunnelling field-effect transistors; conventional TFETs; T-shaped TFET; heterojunction-based line tunnelling device; energy efficient switch; physics-based analytical model; device design parameters; electrical performance; device design optimisation; drain current; epitaxial layer-based heterojunction line TFET; precise boundary conditions; Kane model; voltage; 0; 5; V; FIELD-EFFECT TRANSISTORS;
D O I
10.1049/iet-cds.2018.5169
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The line tunnelling and heterojunction are two important techniques to improve the performance of the tunnelling field-effect transistors (TFETs). The TFETs that utilise both of these techniques perform superior to the conventional TFETs. The recently proposed T-shaped TFET (TTFET) is one such heterojunction-based line tunnelling device that is expected to become energy efficient switch. For the first time, a physics-based analytical model for surface potential and drain current of epitaxial layer-based heterojunction line TFET has been developed. The model describes the impact of device design parameters on the electrical performance of the device. The Poisson equation is solved with precise boundary conditions to obtain the surface potential model. Kane's model is used to calculate drain current by utilising surface potential model. A good agreement between Synopsys technology computer-aided design simulation and analytical model is observed with 5.4% error in on current at V-GS = V-DS = 0.5 V, an average error of 5.80% in surface potential and 7.24% in transconductance. Finally, a device design guideline is presented according to the analytical expressions.
引用
收藏
页码:763 / 770
页数:8
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