An improved sine-wave fitting procedure for characterizing data acquisition channels

被引：118
作者：
Pintelon, R
Schoukens, J
机构：
[1] Department ELEC, Vrije Universiteit Brussel
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1996年 / 45卷 / 02期
关键词：
D O I：
10.1109/19.492793
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a new sine-wave fitting procedure for characterizing data acquisition channels and analog-to-digital converters, It overcomes most of the problems encountered with the classical three- or four-parameter sine-wave fitting procedure described in IEEE Standard 1057. The stochastic properties of the new procedure are thoroughly analyzed, Its performance is illustrated by simulations and measurements with a high-frequency sampling scope.
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页码：588 / 593
页数：6
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