Failure phenomena and mechanisms of polymeric light-emitting diodes: Indium-tin-oxide-damage

被引：66
作者：
Chao, CI [1 ]
Chuang, KR [1 ]
Chen, SA [1 ]
机构：
[1] NATL TSING HUA UNIV,DEPT CHEM ENGN,HSINCHU 30043,TAIWAN
来源：
APPLIED PHYSICS LETTERS | 1996年 / 69卷 / 19期
关键词：
D O I：
10.1063/1.117354
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Indium-tin-oxide (ITO) coated on a glass plate as the transparent electrode in polymeric light-emitting diodes (LEDs) generates some volcano-like patterns during use especially at a higher applied electric field strength. Such an ITO damage phenomenon is independent of Joule heat, conjugation structure of the polymer, and light-emission process, but only dependent on the applied electric field strength. The ITO damage, which results from a self-decomposition reaction, can cause a reduction of lifetime of the device. (C) 1996 American Institute of Physics.
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页码：2894 / 2896
页数：3
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