One-minute nano-tomography using hard X-ray full-field transmission microscope

被引：78

作者：

Ge, Mingyuan ^{[1
]}

Coburn, David Scott ^{[1
]}

Nazaretski, Evgeny ^{[1
]}

Xu, Weihe ^{[1
]}

Gofron, Kazimierz ^{[1
]}

Xu, Huijuan ^{[1
]}

Yin, Zhijian ^{[1
]}

Lee, Wah-Keat ^{[1
]}

机构：

[1] Brookhaven Natl Lab, NSLS 2, Upton, NY 11973 USA

来源：

APPLIED PHYSICS LETTERS | 2018年 / 113卷 / 08期

关键词：

SPATIAL-RESOLUTION; CONTRAST; GROWTH; SSRL;

D O I：

10.1063/1.5048378

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Full field transmission X-ray microscopy (TXM) is a powerful technique for non-destructive 3D imaging with nanometer-scale spatial resolution. However, to date, the typical acquisition time with the hard X-ray TXM at a synchrotron facility is > 10 min for a 3D nano-tomography dataset with sub-50nm spatial resolution. This is a significant limit on the types of 3D dynamics that can be investigated using this technique. Here, we present a demonstration of one-minute nano-tomography with sub-50nm spatial resolution. This achievement is made possible with an in-house designed and commissioned TXM instrument at the Full-field X-ray Imaging beamline at the National Synchrotron Light Source-II at Brookhaven National Laboratory. This capability represents an order of magnitude decrease in the time required for studying sample dynamics with 10 s of nm spatial resolution. Published by AIP Publishing.

引用

页数：4

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