Solid dielectric cable testing: New technologies - New methods

被引：0
|
作者：
Peschel, MT [1 ]
机构：
[1] High Voltage Inc, Copake, NY USA
来源：
NETA: Annual Technical Conference 2003: POWER SYSTEMS MAINTENANCE | 2003年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The intent of this paper is to assess the present day situation regarding high voltage testing of solid dielectric cable. It will discuss current practices by most NETA members for cable testing and the future direction of the industry, namely, DC testing versus AC testing. History, techniques, standards, vendors, and alternative testing methods will be discussed. This paper will describe the present methods of DC cable testing, the problems associated with DC methods, and will explain Very Low Frequency (VLF) technology. Various other methods of cable testing will also be briefly discussed: Tan Delta, Partial Discharge, Recovery Voltage, and Oscillating Wave testing.
引用
收藏
页码：211 / 227
页数：17
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