Spectroscopic examination of two Egyptian masks:: A combined method approach

被引:46
作者
Vandenabeele, P
von Bohlen, A
Moens, L
Klockenkämper, R
Joukes, F
Dewispelaere, G
机构
[1] Univ Ghent, Analyt Chem Lab, B-9000 Ghent, Belgium
[2] Inst Spektrochem & Angew Spektroskopie, D-44139 Dortmund, Germany
[3] Acad Fine Arts, Dept Restaurat & Conservat Polychrome Statues, B-2000 Antwerp, Belgium
关键词
art analysis; total-reflection X-ray fluorescence analysis (TXRF); Micro-Raman spectroscopy (MRS); pigment analysis; combined method approach; micro sampling methods; Egyptian masks; pararealgar; orpiment; realgar; vermilion; iron oxide;
D O I
10.1080/00032719.2000.10399503
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The identification of the materials used in painted works of art is of great importance for (art-) historians, conservators and keepers. Total-reflection X-Ray Fluorescence analysis (TXRF) as well as Micro-Raman Spectroscopy (MLRS) have been shown to be successful in the identification of the pigments in artefacts, such as mediaeval manuscripts, polychrome sculptures as well as panel-, easel- and wall-painting. In this work the advantages of a combined method approach are demonstrated and as a case study, the examination of two classical. Egyptian masks is presented. A gentle micro sampling method, which does not leave any visible trace on the artefacts was used and both of the analytical methods, TXRF and MRS, are performed on the same samples, giving complementary information.
引用
收藏
页码:3315 / 3332
页数:18
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