SIM-RIXS: a program to simulate resonant inelastic X-ray scattering

被引:14
|
作者
Hayashi, Hisashi [1 ]
机构
[1] Japan Womens Univ, Dept Chem & Biol Sci, Fac Sci, Bunkyo Ku, Tokyo 1128681, Japan
关键词
NEAR-EDGE STRUCTURE; SELECTIVE XAFS; SPECTROSCOPY; SPECTRA; VALENCE; XANES; PR;
D O I
10.1002/xrs.1285
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
We have developed a program for simulating resonant inelastic X-ray scattering (RIXS), SIM-RIXS that can be run on personal computerswithaMicrosoftWindowsXP/Vista operating system. RIXS primarily reflects lifetime-broadening-suppressed (LBS) or lifetime-broadening-suppressed state-selective (LBSS) X-ray absorption fine structure (XAFS). SIM-RIXS can convert theoretical LBS/LBSS-XAFS profiles to RIXS spectra, and it can derive an optimal LBS/LBSS-XAFS profile to reproduce experimental RIXS spectra. SIM-RIXS has three basic modules, and each user-friendly graphical user interface enables even novices, who are unfamiliar with RIXS analysis, to use this software. In this software, the first module sets conditions using conventional XAFS data; the second module does the same for conventional X-ray fluorescence data; and the third module is used for RIXS simulation based on the Tulkki-angstrom berg equation. An example of its application to the EuL gamma(4) RIXS of Eu2O3 is presented. SIM-RIXS can readily provide a basic description of the excitation and emission energy dependence of EuL gamma(4) RIXS, elucidating the existence of the 'hidden' peak at 8056 eV in the Eu(III) L-1-XAFS. This demonstrates the usefulness of SIM-RIXS in RIXS analyses. Copyright (C) 2011 John Wiley & Sons, Ltd.
引用
收藏
页码:24 / 30
页数:7
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