Nanoscale resolution in the focal plane of an optical microscope

被引:348
作者
Westphal, V [1 ]
Hell, SW [1 ]
机构
[1] Max Planck Inst Biophys Chem, Dept Nanobiophoton, D-37070 Gottingen, Germany
关键词
D O I
10.1103/PhysRevLett.94.143903
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Utilizing single fluorescent molecules as probes, we prove the ability of a far-field microscope to attain spatial resolution down to 16 nm in the focal plane, corresponding to about 1/50 of the employed wavelength. The optical bandwidth expansion by nearly an order of magnitude is realized by a saturated depletion through stimulated emission of the molecular fluorescent state. We demonstrate that en route to the molecular scale, the resolving power increases with the square root of the saturation level, which constitutes a new law regarding the resolution of an emerging class of far-field light microscopes that are not limited by diffraction.
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页数:4
相关论文
共 12 条
[1]  
Abbe E., 1873, Archiv f)r mikroskopische Anatomie, V9, P413, DOI DOI 10.1007/BF02956173
[2]   Quantum interferometric optical lithography: Exploiting entanglement to beat the diffraction limit [J].
Boto, AN ;
Kok, P ;
Abrams, DS ;
Braunstein, SL ;
Williams, CP ;
Dowling, JP .
PHYSICAL REVIEW LETTERS, 2000, 85 (13) :2733-2736
[3]   Sharper focus for a radially polarized light beam [J].
Dorn, R ;
Quabis, S ;
Leuchs, G .
PHYSICAL REVIEW LETTERS, 2003, 91 (23)
[4]   Focal spots of size λ/23 open up far-field florescence microscopy at 33 nm axial resolution -: art. no. 163901 [J].
Dyba, M ;
Hell, SW .
PHYSICAL REVIEW LETTERS, 2002, 88 (16) :4-163901
[5]   Enhancing the resolution of scanning near-field optical microscopy by a metal tip grown on an aperture probe [J].
Frey, HG ;
Keilmann, F ;
Kriele, A ;
Guckenberger, R .
APPLIED PHYSICS LETTERS, 2002, 81 (26) :5030-5032
[6]   High-resolution near-field Raman microscopy of single-walled carbon nanotubes -: art. no. 095503 [J].
Hartschuh, A ;
Sánchez, EJ ;
Xie, XS ;
Novotny, L .
PHYSICAL REVIEW LETTERS, 2003, 90 (09) :4
[7]   Strategy for far-field optical imaging and writing without diffraction limit [J].
Hell, SW .
PHYSICS LETTERS A, 2004, 326 (1-2) :140-145
[8]   BREAKING THE DIFFRACTION RESOLUTION LIMIT BY STIMULATED-EMISSION - STIMULATED-EMISSION-DEPLETION FLUORESCENCE MICROSCOPY [J].
HELL, SW ;
WICHMANN, J .
OPTICS LETTERS, 1994, 19 (11) :780-782
[9]   Breaking Abbe's diffraction resolution limit in fluorescence microscopy with stimulated emission depletion beams of various shapes [J].
Klar, TA ;
Engel, E ;
Hell, SW .
PHYSICAL REVIEW E, 2001, 64 (06) :9-066613
[10]   High resolution 3D x-ray diffraction microscopy [J].
Miao, JW ;
Ishikawa, T ;
Johnson, B ;
Anderson, EH ;
Lai, B ;
Hodgson, KO .
PHYSICAL REVIEW LETTERS, 2002, 89 (08) :088303/1-088303/4