共 36 条
[1]
Thick junction broadband organic photodiodes
[J].
Armin, Ardalan
;
Hambsch, Mike
;
Kim, Il Ku
;
Burn, Paul L.
;
Meredith, Paul
;
Namdas, Ebinazar B.
.
LASER & PHOTONICS REVIEWS,
2014, 8 (06)
:924-932

Armin, Ardalan
论文数: 0 引用数: 0
h-index: 0
机构: Univ Queensland, Ctr Organ Photon & Elect, Sch Math & Phys, Brisbane, Qld 4072, Australia

Hambsch, Mike
论文数: 0 引用数: 0
h-index: 0
机构: Univ Queensland, Ctr Organ Photon & Elect, Sch Math & Phys, Brisbane, Qld 4072, Australia

Kim, Il Ku
论文数: 0 引用数: 0
h-index: 0
机构: Univ Queensland, Ctr Organ Photon & Elect, Sch Math & Phys, Brisbane, Qld 4072, Australia

Burn, Paul L.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Queensland, Ctr Organ Photon & Elect, Sch Math & Phys, Brisbane, Qld 4072, Australia

Meredith, Paul
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Queensland, Ctr Organ Photon & Elect, Sch Math & Phys, Brisbane, Qld 4072, Australia Univ Queensland, Ctr Organ Photon & Elect, Sch Math & Phys, Brisbane, Qld 4072, Australia

Namdas, Ebinazar B.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Queensland, Ctr Organ Photon & Elect, Sch Math & Phys, Brisbane, Qld 4072, Australia
[2]
Organic Light Detectors: Photodiodes and Phototransistors
[J].
Baeg, Kang-Jun
;
Binda, Maddalena
;
Natali, Dario
;
Caironi, Mario
;
Noh, Yong-Young
.
ADVANCED MATERIALS,
2013, 25 (31)
:4267-4295

Baeg, Kang-Jun
论文数: 0 引用数: 0
h-index: 0
机构:
KERI, Nano Carbon Mat Res Grp, Chang Won 642120, Gyeongsangnam D, South Korea Dongguk Univ, Dept Energy & Mat Engn, Seoul 100715, South Korea

Binda, Maddalena
论文数: 0 引用数: 0
h-index: 0
机构:
Ist Italiano Tecnol, Ctr Nano Sci & Technol PoliMi, I-20133 Milan, Italy Dongguk Univ, Dept Energy & Mat Engn, Seoul 100715, South Korea

Natali, Dario
论文数: 0 引用数: 0
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机构:
Ist Italiano Tecnol, Ctr Nano Sci & Technol PoliMi, I-20133 Milan, Italy
Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy Dongguk Univ, Dept Energy & Mat Engn, Seoul 100715, South Korea

Caironi, Mario
论文数: 0 引用数: 0
h-index: 0
机构:
Ist Italiano Tecnol, Ctr Nano Sci & Technol PoliMi, I-20133 Milan, Italy Dongguk Univ, Dept Energy & Mat Engn, Seoul 100715, South Korea

Noh, Yong-Young
论文数: 0 引用数: 0
h-index: 0
机构:
Dongguk Univ, Dept Energy & Mat Engn, Seoul 100715, South Korea Dongguk Univ, Dept Energy & Mat Engn, Seoul 100715, South Korea
[3]
A hybrid CMOS-imager with a solution-processable polymer as photoactive layer
[J].
Baierl, Daniela
;
Pancheri, Lucio
;
Schmidt, Morten
;
Stoppa, David
;
Dalla Betta, Gian-Franco
;
Scarpa, Giuseppe
;
Lugli, Paolo
.
NATURE COMMUNICATIONS,
2012, 3

Baierl, Daniela
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany

Pancheri, Lucio
论文数: 0 引用数: 0
h-index: 0
机构:
Fdn Bruno Kessler, I-38123 Trento, Italy Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany

Schmidt, Morten
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany

Stoppa, David
论文数: 0 引用数: 0
h-index: 0
机构:
Fdn Bruno Kessler, I-38123 Trento, Italy Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany

Dalla Betta, Gian-Franco
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Trento, Dept Informat Engn & Comp Sci, I-38123 Trento, Italy Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany

Scarpa, Giuseppe
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany

Lugli, Paolo
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany
[4]
Improving spray coated organic photodetectors performance by using 1,8-diiodooctane as processing additive
[J].
Benavides, Cindy Montenegro
;
Rechberger, Stefanie
;
Spiecker, Erdmann
;
Berlinghof, Marvin
;
Unruh, Tobias
;
Biele, Markus
;
Schmidt, Oliver
;
Brabec, Christoph J.
;
Tedde, Sandro F.
.
ORGANIC ELECTRONICS,
2018, 54
:21-26

Benavides, Cindy Montenegro
论文数: 0 引用数: 0
h-index: 0
机构:
Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany
Friedrich Alexander Univ Erlangen Nurnberg, I MEET, Dept Mat Sci, Martensstr 7, D-91058 Erlangen, Germany Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany

Rechberger, Stefanie
论文数: 0 引用数: 0
h-index: 0
机构:
Friedrich Alexander Univ Erlangen Nurnberg, I MEET, Dept Mat Sci, Martensstr 7, D-91058 Erlangen, Germany
Friedrich Alexander Univ Erlangen Nurnberg, Inst Micro & Nanostruct Res, Cauerstr 6, D-91058 Erlangen, Germany
Friedrich Alexander Univ Erlangen Nurnberg, Ctr Nanoanal & Electron Microscopy CENEM, Cauerstr 6, D-91058 Erlangen, Germany Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany

Spiecker, Erdmann
论文数: 0 引用数: 0
h-index: 0
机构:
Friedrich Alexander Univ Erlangen Nurnberg, I MEET, Dept Mat Sci, Martensstr 7, D-91058 Erlangen, Germany
Friedrich Alexander Univ Erlangen Nurnberg, Inst Micro & Nanostruct Res, Cauerstr 6, D-91058 Erlangen, Germany
Friedrich Alexander Univ Erlangen Nurnberg, Ctr Nanoanal & Electron Microscopy CENEM, Cauerstr 6, D-91058 Erlangen, Germany Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany

Berlinghof, Marvin
论文数: 0 引用数: 0
h-index: 0
机构:
Friedrich Alexander Univ Erlangen Nurnberg, I MEET, Dept Mat Sci, Martensstr 7, D-91058 Erlangen, Germany
Friedrich Alexander Univ Erlangen Nurnberg, Dept Phys, Inst Crystallog & Struct Phys, Staudtstr 3, D-91058 Erlangen, Germany Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany

Unruh, Tobias
论文数: 0 引用数: 0
h-index: 0
机构:
Friedrich Alexander Univ Erlangen Nurnberg, I MEET, Dept Mat Sci, Martensstr 7, D-91058 Erlangen, Germany
Friedrich Alexander Univ Erlangen Nurnberg, Dept Phys, Inst Crystallog & Struct Phys, Staudtstr 3, D-91058 Erlangen, Germany Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany

Biele, Markus
论文数: 0 引用数: 0
h-index: 0
机构:
Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany
Friedrich Alexander Univ Erlangen Nurnberg, I MEET, Dept Mat Sci, Martensstr 7, D-91058 Erlangen, Germany Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany

Schmidt, Oliver
论文数: 0 引用数: 0
h-index: 0
机构:
Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany

Brabec, Christoph J.
论文数: 0 引用数: 0
h-index: 0
机构:
Friedrich Alexander Univ Erlangen Nurnberg, I MEET, Dept Mat Sci, Martensstr 7, D-91058 Erlangen, Germany
ZAE Bayern, Renewable Energies, Immerwahrstr 2, D-91058 Erlangen, Germany Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany

Tedde, Sandro F.
论文数: 0 引用数: 0
h-index: 0
机构:
Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany Siemens Healthcare GmbH, Technol Ctr, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany
[5]
Hierarchical Nanomorphologies Promote Exciton Dissociation in Polymer/Fullerene Bulk Heterojunction Solar Cells
[J].
Chen, Wei
;
Xu, Tao
;
He, Feng
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Wang, Wei
;
Wang, Cheng
;
Strzalka, Joseph
;
Liu, Yun
;
Wen, Jianguo
;
Miller, Dean J.
;
Chen, Jihua
;
Hong, Kunlun
;
Yu, Luping
;
Darling, Seth B.
.
NANO LETTERS,
2011, 11 (09)
:3707-3713

Chen, Wei
论文数: 0 引用数: 0
h-index: 0
机构:
Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Xu, Tao
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Chicago, Dept Chem, Chicago, IL 60637 USA
Univ Chicago, James Franck Inst, Chicago, IL 60637 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

He, Feng
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Chicago, Dept Chem, Chicago, IL 60637 USA
Univ Chicago, James Franck Inst, Chicago, IL 60637 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Wang, Wei
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Chicago, Dept Chem, Chicago, IL 60637 USA
Univ Chicago, James Franck Inst, Chicago, IL 60637 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Wang, Cheng
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Strzalka, Joseph
论文数: 0 引用数: 0
h-index: 0
机构:
Argonne Natl Lab, Adv Photon Source, Xray Sci Div, Lemont, IL 60439 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Liu, Yun
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Stand & Technol, NIST Ctr Neutron Res, Gaithersburg, MD 20899 USA
Univ Delaware, Dept Chem Engn, Newark, DE 19716 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Wen, Jianguo
论文数: 0 引用数: 0
h-index: 0
机构:
Argonne Natl Lab, Ctr Electron Microscopy, Lemont, IL 60439 USA
Argonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Miller, Dean J.
论文数: 0 引用数: 0
h-index: 0
机构:
Argonne Natl Lab, Ctr Electron Microscopy, Lemont, IL 60439 USA
Argonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Chen, Jihua
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Hong, Kunlun
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Yu, Luping
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Chicago, Dept Chem, Chicago, IL 60637 USA
Univ Chicago, James Franck Inst, Chicago, IL 60637 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

Darling, Seth B.
论文数: 0 引用数: 0
h-index: 0
机构:
Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA
[6]
Interface modification to improve hole-injection properties in organic electronic devices
[J].
Choulis, SA
;
Choong, VE
;
Patwardhan, A
;
Mathai, MK
;
So, F
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ADVANCED FUNCTIONAL MATERIALS,
2006, 16 (08)
:1075-1080

Choulis, SA
论文数: 0 引用数: 0
h-index: 0
机构:
Osram Opto Semicond Inc, San Jose, CA 95134 USA Osram Opto Semicond Inc, San Jose, CA 95134 USA

Choong, VE
论文数: 0 引用数: 0
h-index: 0
机构: Osram Opto Semicond Inc, San Jose, CA 95134 USA

Patwardhan, A
论文数: 0 引用数: 0
h-index: 0
机构: Osram Opto Semicond Inc, San Jose, CA 95134 USA

Mathai, MK
论文数: 0 引用数: 0
h-index: 0
机构: Osram Opto Semicond Inc, San Jose, CA 95134 USA

So, F
论文数: 0 引用数: 0
h-index: 0
机构: Osram Opto Semicond Inc, San Jose, CA 95134 USA
[7]
X-Ray Detector-on-Plastic With High Sensitivity Using Low Cost, Solution-Processed Organic Photodiodes
[J].
Gelinck, Gerwin H.
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Kumar, Abhishek
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Moet, Date
;
van der Steen, Jan-Laurens P. J.
;
van Breemen, Albert J. J. M.
;
Shanmugam, Santosh
;
Langen, Arjan
;
Gilot, Jan
;
Groen, Pim
;
Andriessen, Ronn
;
Simon, Matthias
;
Ruetten, Walter
;
Douglas, Alexander U.
;
Raaijmakers, Rob
;
Malinowski, Pawel E.
;
Myny, Kris
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
2016, 63 (01)
:197-204

Gelinck, Gerwin H.
论文数: 0 引用数: 0
h-index: 0
机构:
TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands
Tech Univ Eindhoven, Dept Appl Phys, NL-5612 AZ Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Kumar, Abhishek
论文数: 0 引用数: 0
h-index: 0
机构:
TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Moet, Date
论文数: 0 引用数: 0
h-index: 0
机构:
TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

van der Steen, Jan-Laurens P. J.
论文数: 0 引用数: 0
h-index: 0
机构:
TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

van Breemen, Albert J. J. M.
论文数: 0 引用数: 0
h-index: 0
机构:
TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Shanmugam, Santosh
论文数: 0 引用数: 0
h-index: 0
机构:
TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Langen, Arjan
论文数: 0 引用数: 0
h-index: 0
机构:
TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Gilot, Jan
论文数: 0 引用数: 0
h-index: 0
机构:
TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Groen, Pim
论文数: 0 引用数: 0
h-index: 0
机构:
TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Andriessen, Ronn
论文数: 0 引用数: 0
h-index: 0
机构:
TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Simon, Matthias
论文数: 0 引用数: 0
h-index: 0
机构:
Philips Res, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Ruetten, Walter
论文数: 0 引用数: 0
h-index: 0
机构:
Philips Res, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Douglas, Alexander U.
论文数: 0 引用数: 0
h-index: 0
机构:
Philips Res, NL-5656 AE Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Raaijmakers, Rob
论文数: 0 引用数: 0
h-index: 0
机构:
Philips Healthcare, NL-5621 JG Eindhoven, Netherlands TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Malinowski, Pawel E.
论文数: 0 引用数: 0
h-index: 0
机构:
IMEC, B-3001 Leuven, Belgium TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands

Myny, Kris
论文数: 0 引用数: 0
h-index: 0
机构:
IMEC, B-3001 Leuven, Belgium TNO, Holst Ctr, NL-5656 AE Eindhoven, Netherlands
[8]
X-ray imager using solution processed organic transistor arrays and bulk heterojunction photodiodes on thin, flexible plastic substrate
[J].
Gelinck, Gerwin H.
;
Kumar, Abhishek
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Moet, Date
;
van der Steen, Jan-Laurens
;
Shafique, Umar
;
Malinowski, Pawel E.
;
Myny, Kris
;
Rand, Barry P.
;
Simon, Matthias
;
Rutten, Walter
;
Douglas, Alexander
;
Jorritsma, Jorrit
;
Heremans, Paul
;
Andriessen, Ronn
.
ORGANIC ELECTRONICS,
2013, 14 (10)
:2602-2609

Gelinck, Gerwin H.
论文数: 0 引用数: 0
h-index: 0
机构:
Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Kumar, Abhishek
论文数: 0 引用数: 0
h-index: 0
机构:
Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Moet, Date
论文数: 0 引用数: 0
h-index: 0
机构:
Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

van der Steen, Jan-Laurens
论文数: 0 引用数: 0
h-index: 0
机构:
Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Shafique, Umar
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Malinowski, Pawel E.
论文数: 0 引用数: 0
h-index: 0
机构:
IMEC VZW, Dept Large Area Elect, B-3001 Louvain, Belgium Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Myny, Kris
论文数: 0 引用数: 0
h-index: 0
机构:
IMEC VZW, Dept Large Area Elect, B-3001 Louvain, Belgium Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Rand, Barry P.
论文数: 0 引用数: 0
h-index: 0
机构:
IMEC VZW, Dept Large Area Elect, B-3001 Louvain, Belgium Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Simon, Matthias
论文数: 0 引用数: 0
h-index: 0
机构:
Philips Res, NL-5656 AE Eindhoven, Netherlands Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Rutten, Walter
论文数: 0 引用数: 0
h-index: 0
机构:
Philips Res, NL-5656 AE Eindhoven, Netherlands Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Douglas, Alexander
论文数: 0 引用数: 0
h-index: 0
机构:
Philips Res, NL-5656 AE Eindhoven, Netherlands Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Jorritsma, Jorrit
论文数: 0 引用数: 0
h-index: 0
机构:
Philips Healthcare, NL-5684 PC Best, Netherlands Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Heremans, Paul
论文数: 0 引用数: 0
h-index: 0
机构:
IMEC VZW, Dept Large Area Elect, B-3001 Louvain, Belgium Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands

Andriessen, Ronn
论文数: 0 引用数: 0
h-index: 0
机构:
Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands Holst Ctr TNO, NL-5656 AE Eindhoven, Netherlands
[9]
Amorphous silicon X-ray detectors
[J].
Hoheisel, M
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Arques, M
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Chabbal, J
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Chaussat, C
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Ducourant, T
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Hahm, G
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Horbaschek, H
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Schulz, R
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Spahn, M
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JOURNAL OF NON-CRYSTALLINE SOLIDS,
1998, 227
:1300-1305

Hoheisel, M
论文数: 0 引用数: 0
h-index: 0
机构: Siemens AG, Med Engn, Basic Dev, D-91050 Erlangen, Germany

Arques, M
论文数: 0 引用数: 0
h-index: 0
机构: Siemens AG, Med Engn, Basic Dev, D-91050 Erlangen, Germany

Chabbal, J
论文数: 0 引用数: 0
h-index: 0
机构: Siemens AG, Med Engn, Basic Dev, D-91050 Erlangen, Germany

Chaussat, C
论文数: 0 引用数: 0
h-index: 0
机构: Siemens AG, Med Engn, Basic Dev, D-91050 Erlangen, Germany

Ducourant, T
论文数: 0 引用数: 0
h-index: 0
机构: Siemens AG, Med Engn, Basic Dev, D-91050 Erlangen, Germany

Hahm, G
论文数: 0 引用数: 0
h-index: 0
机构: Siemens AG, Med Engn, Basic Dev, D-91050 Erlangen, Germany

Horbaschek, H
论文数: 0 引用数: 0
h-index: 0
机构: Siemens AG, Med Engn, Basic Dev, D-91050 Erlangen, Germany

Schulz, R
论文数: 0 引用数: 0
h-index: 0
机构: Siemens AG, Med Engn, Basic Dev, D-91050 Erlangen, Germany

Spahn, M
论文数: 0 引用数: 0
h-index: 0
机构: Siemens AG, Med Engn, Basic Dev, D-91050 Erlangen, Germany
[10]
Topographical and morphological aspects of spray coated organic photovoltaics
[J].
Hoth, Claudia N.
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Steim, Roland
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Schilinsky, Pavel
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Choulis, Stelios A.
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Tedde, Sandro F.
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Hayden, Oliver
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Brabec, Christoph J.
.
ORGANIC ELECTRONICS,
2009, 10 (04)
:587-593

Hoth, Claudia N.
论文数: 0 引用数: 0
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Carl von Ossietzky Univ Oldenburg, Dept Energy & Semicond Res, D-26129 Oldenburg, Germany Konarka Technol GmbH, D-90443 Nurnberg, Germany

Steim, Roland
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Univ Karlsruhe TH, Light Technol Inst, D-76131 Karlsruhe, Germany Konarka Technol GmbH, D-90443 Nurnberg, Germany

Schilinsky, Pavel
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Choulis, Stelios A.
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Cyprus Univ Technol, Dept Mech Engn & Mat Sci & Engn, CY-3603 Limassol, Cyprus Konarka Technol GmbH, D-90443 Nurnberg, Germany

Tedde, Sandro F.
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Siemens AG, Corp Technol, CT MM1, D-91058 Erlangen, Germany Konarka Technol GmbH, D-90443 Nurnberg, Germany

Hayden, Oliver
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Brabec, Christoph J.
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