The Belle-II DEPFET pixel detector: A step forward in vertexing in the superKEKB flavour factory

被引:20
作者
Marinas, C. [1 ]
Vos, M. [1 ]
机构
[1] CSIC UVEG, IFIC, Inst Fis Corpuscular, Valencia, Spain
关键词
SuperKEKB; Belle-II; DEPFET; Pixel detector; ASIC; Mechanics; Cooling; Resolution; BEAM; ILC;
D O I
10.1016/j.nima.2010.12.116
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An upgrade of the successful asymmetric e(+)e(-) collider in KEK (Tsukuba, Japan) is foreseen by the fall of 2013. This new Super Flavor Factory will deliver an increased instantaneous luminosity of up to L = 8 x 10(35) cm(-2) s(-1), 40 times larger than the current KEKB machine. To exploit these new conditions and provide high precision measurements of the decay vertex of the B meson systems, a new silicon vertex detector will be operated in Belle. This new detector will consist of two layers of DEPFET Active Pixel Sensors as close as possible to the interaction point. DEPFET is a field effect transistor, with an additional deep implant underneath the channel's gate, integrated on a completely depleted bulk. This technology offers detection and an in-pixel amplification stage, while keeping low the power consumption. Under these conditions, thin sensors with small pixel size and low intrinsic noise are possible. In this article, an overview of the full system will be described, including the sensor, the front-end electronics and both the mechanical and thermal proposed solutions as well as the expected performance. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:59 / 63
页数:5
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