共 50 条
- [33] Analysis of Stress in Silicon-Based Microsystems by X-ray Diffraction Techniques 2013 EUROPEAN MICROELECTRONICS PACKAGING CONFERENCE (EMPC), 2013,
- [37] X-ray diffraction analysis of molten trivalent halides JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1999, 38 : 156 - 159
- [38] Residual stress and microstructure analysis with X-ray diffraction PROCEEDINGS OF THE SIXTEENTH (2006) INTERNATIONAL OFFSHORE AND POLAR ENGINEERING CONFERENCE, VOL 4, 2006, : 37 - 42