Highly oriented epitaxial CaFe2O4 thin films on TiO2 substrates grown by pulsed-laser deposition

被引：1
|
作者：
Nishiyama, Nana [1 ]
Mashiko, Hisanori [1 ]
Yoshimatsu, Kohei [1 ]
Horiba, Koji [2 ,3 ]
Kumigashira, Hiroshi [2 ,3 ]
Ohtomo, Akira [1 ,3 ]
机构：
[1] Tokyo Inst Technol, Dept Chem Sci & Engn, Meguro Ku, 2-12-1 Ookayama, Tokyo 1528552, Japan
[2] High Energy Accelerator Res Org, Photon Factory, Inst Mat Struct Sci, KEK, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan
[3] Tokyo Inst Technol, Mat Res Ctr Element Strategy MCES, Yokohama, Kanagawa 2268503, Japan
来源：
THIN SOLID FILMS | 2017年 / 638卷
基金：
日本学术振兴会;
关键词：
CaFe2O4; Pulsed-laser deposition; X-ray diffraction; X-ray absorption spectroscopy; Heteroepitaxy; WATER; PHOTOCATALYSIS; SEMICONDUCTORS; ANISOTROPY; HYDROGEN;
D O I：
10.1016/j.tsf.2017.08.003
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
CaFe2O4 (CFO) is an oxide semiconductor being usable for a photocathode, but its single crystal is so-far grown only by a high-pressure bulk synthesis method. Using pulsed-laser deposition, we have obtained the (010)-oriented CFO films on TiO2 (100) substrates. The epitaxial structure included twin domains with 15 tilting from the surface normal and sixfold domains with in-plane rotations oft +/- 70 degrees with respect to the b axis of TiO2, which was explained by taking a number of probable arrangements between FeO6 and TiO6 octahedra into account. X-ray absorption spectroscopy and ultra-violet-visible-near-infrared spectroscopy measurements revealed the electronic properties similar to those of bulk and thus the CFO films would be suitable to the investigation of photocathodic performance. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码：406 / 409
页数：4
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