On the merits of temporal testers

被引:0
|
作者
Pnueli, A. [1 ]
Zaks, A. [1 ]
机构
[1] NYU, New York, NY 10003 USA
来源
25 YEARS OF MODEL CHECKING: HISTORY, ACHIEVEMENTS, PERSPECTIVES | 2008年 / 5000卷
关键词
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
The paper discusses the merits of temporal testers, which can serve as a compositional basis for automata construction corresponding to temporal formulas in the context of LTL, PSL, and MITL logics. Temporal testers can be viewed as (non-deterministic) transducers that, at any point, output a boolean value which is 1 iff the corresponding temporal formula holds starting at the current position. The main advantage of testers, compared to acceptors (such as Buchi automata) is their compositionality. Namely, a tester for a compound formula can be constructed out of the testers for its sub-formulas. Besides providing the construction of testers for formulas specified in LTL, PSL, and MITL, the paper also presents a general overview of the tester methodology, and highlights some of the unique features and applications of transducers including compositional deductive verification of LTL properties.
引用
收藏
页码:172 / 195
页数:24
相关论文
共 50 条
  • [1] Model Checking for Real-time Branching-time Temporal Logic Based on Temporal Testers
    Luo X.-Y.
    Huang X.-Y.
    Gu T.-L.
    Su K.-L.
    Chen Z.-X.
    Zheng L.-X.
    Ruan Jian Xue Bao/Journal of Software, 2022, 33 (08): : 2930 - 2946
  • [2] The merits of merits review
    Landrigan, Mitchell
    Telecommunication Journal of Australia, 2002, 52 (02) : 55 - 61
  • [3] CPSGrader: Synthesizing Temporal Logic Testers for Auto-Grading an Embedded Systems Laboratory
    Juniwal, Garvit
    Donze, Alexandre
    Jensen, Jeff C.
    Seshia, Sanjit A.
    2014 INTERNATIONAL CONFERENCE ON EMBEDDED SOFTWARE (EMSOFT), 2014,
  • [4] PORTABLE TESTERS
    Darcon, Alan
    MICROWAVES & RF, 2013, 52 (01) : 19 - 19
  • [5] Top testers
    不详
    MATERIALS WORLD, 1998, 6 (02) : 117 - 126
  • [6] SINS OF THE TESTERS
    不详
    ECONOMIST, 1962, 203 (11): : 1105 - 1105
  • [7] Taste testers
    Powell, Devin
    NEW SCIENTIST, 2008, 199 (2671) : 22 - 23
  • [8] Trust in testers
    White, John
    LONDON REVIEW OF EDUCATION, 2013, 11 (01) : 1 - 6
  • [9] TESTING TESTERS
    SCHILD, W
    JOURNAL OF THE AUDIO ENGINEERING SOCIETY, 1983, 31 (05): : 360 - 360
  • [10] Mitutoyo testers
    不详
    AIRCRAFT ENGINEERING AND AEROSPACE TECHNOLOGY, 1996, 68 (03): : 46 - 47