Local piezoelectric hysteresis loops for the study of electrical properties of 0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3 thin films:: Bottom electrode dependence and film thickness effect

被引：7

作者：

Ferri, A. ^{[1
]}

Da Costa, A. ^{[1
]}

Saitzek, S. ^{[1
]}

Desfeux, R. ^{[1
]}

Detalle, M. ^{[2
]}

Wang, G. S. ^{[2
]}

Remiens, D. ^{[2
]}

机构：

[1] Univ Artois, Fac Sci Jean Perrin, FRE 2485, FR CNRS 2638,IMMCL Federat Chevreul,LPCIA, F-62307 Lens, France

[2] Univ Valenciennes, IEMN DOAE MIMM, CNRS, UMR 8520, F-59313 Valenciennes, France

来源：

FERROELECTRICS | 2008年 / 362卷

关键词：

PMN-PT thin films; Pt and LNO bottom electrodes; nanoscale investigations; atomic force microscopy; local piezoelectric hysteresis loops;

D O I：

10.1080/00150190801997427

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

0.7Pb(Mg1/3O2/3)O-3-0.3PbTiO(3) (PMN-PT 70/30) thin films, 400 and 600 nm thick, have been grown on Pt and LaNiO3 (LNO) bottom electrodes by if magnetron sputtering. For each thickness, local piezoelectric hysteresis loops evidence that the individual PMN-PT grains deposited on LNO always require much higher voltage than the ones grown on Pt for switching. The average piezoelectric activity of grains is shown to be the highest for LNO electrode. For each electrode,film thickness has no significantly effect on the average coercive voltage and piezoelectric activity measured on the loops. A simple charge model explains this result.

引用

收藏

页码：21 / 29

页数：9

相关论文

共 20 条

[11] Fabrication and investigation of ultrathin, and smooth Pb(Zr,Ti)O3 films for miniaturization of microelectronic devices [J].

Hong, J ;

Song, HW ;

Hong, S ;

Shin, H ;

No, K .

JOURNAL OF APPLIED PHYSICS, 2002, 92 (12) :7434-7441

[12] Materials contrast in piezoresponse force microscopy [J].

Kalinin, Sergei V. ;

Eliseev, Eugene A. ;

Morozovska, Anna N. .

APPLIED PHYSICS LETTERS, 2006, 88 (23)

[13] Nanoelectromechanics of piezoresponse force microscopy [J].

Kalinin, SV ;

Karapetian, E ;

Kachanov, M .

PHYSICAL REVIEW B, 2004, 70 (18) :1-24

[14] Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces [J].

Kalinin, SV ;

Bonnell, DA .

PHYSICAL REVIEW B, 2002, 65 (12) :1-11

[15] Thickness effect of ferroelectric domain switching in epitaxial PbTiO3 thin films on Pt(001)/MgO(001) [J].

Kim, YK ;

Kim, SS ;

Shin, H ;

Baik, S .

APPLIED PHYSICS LETTERS, 2004, 84 (25) :5085-5087

[16] Effect of mechanical constraint on the dielectric and piezoelectric behavior of epitaxial Pb(Mg1/3Nb2/3)O3(90%)-PbTiO3(10%) relaxor thin films [J].

Nagarajan, V ;

Ganpule, CS ;

Nagaraj, B ;

Aggarwal, S ;

Alpay, SP ;

Roytburd, AL ;

Williams, ED ;

Ramesh, R .

APPLIED PHYSICS LETTERS, 1999, 75 (26) :4183-4185

[17] Direct characterization of nanoscale domain switching and local piezoelectric loops of (Pb,La)TiO3 thin films by piezoresponse force microscopy [J].

Poyato, R ;

Calzada, ML ;

Shvartsman, VV ;

Kholkin, A ;

Vilarinho, P ;

Pardo, L .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2005, 81 (06) :1207-1212

[18] Nonlinear local piezoelectric deformation in ferroelectric thin films studied by scanning force microscopy [J].

Shvartsman, VV ;

Pertsev, NA ;

Herrero, JM ;

Zaldo, C ;

Kholkin, AL .

JOURNAL OF APPLIED PHYSICS, 2005, 97 (10)

[19] Piezoelectric properties of rhombohedral Pb(Zr, Ti)O3 thin films with (100), (111), and "random" crystallographic orientation [J].

Taylor, DV ;

Damjanovic, D .

APPLIED PHYSICS LETTERS, 2000, 76 (12) :1615-1617

[20] Preparation of highly (100)-oriented LaNiO3 nanocrystalline films by metalorganic chemical liquid deposition [J].

Wang, GS ;

Zhao, Q ;

Meng, XJ ;

Chu, JH ;

Rémiens, D .

JOURNAL OF CRYSTAL GROWTH, 2005, 277 (1-4) :450-456