Local piezoelectric hysteresis loops for the study of electrical properties of 0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3 thin films:: Bottom electrode dependence and film thickness effect

被引：7
作者：
Ferri, A. [1 ]
Da Costa, A. [1 ]
Saitzek, S. [1 ]
Desfeux, R. [1 ]
Detalle, M. [2 ]
Wang, G. S. [2 ]
Remiens, D. [2 ]
机构：
[1] Univ Artois, Fac Sci Jean Perrin, FRE 2485, FR CNRS 2638,IMMCL Federat Chevreul,LPCIA, F-62307 Lens, France
[2] Univ Valenciennes, IEMN DOAE MIMM, CNRS, UMR 8520, F-59313 Valenciennes, France
来源：
FERROELECTRICS | 2008年 / 362卷
关键词：
PMN-PT thin films; Pt and LNO bottom electrodes; nanoscale investigations; atomic force microscopy; local piezoelectric hysteresis loops;
D O I：
10.1080/00150190801997427
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
0.7Pb(Mg1/3O2/3)O-3-0.3PbTiO(3) (PMN-PT 70/30) thin films, 400 and 600 nm thick, have been grown on Pt and LaNiO3 (LNO) bottom electrodes by if magnetron sputtering. For each thickness, local piezoelectric hysteresis loops evidence that the individual PMN-PT grains deposited on LNO always require much higher voltage than the ones grown on Pt for switching. The average piezoelectric activity of grains is shown to be the highest for LNO electrode. For each electrode,film thickness has no significantly effect on the average coercive voltage and piezoelectric activity measured on the loops. A simple charge model explains this result.
引用
收藏
页码：21 / 29
页数：9
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  • [1] Comparative analysis for the crystalline and ferroelectric properties of Pb(Zr,Ti)O3 thin films deposited on metallic LaNiO3 and Pt electrodes
    Chae, BG
    Yang, YS
    Lee, SH
    Jang, MS
    Lee, SJ
    Kim, SH
    Baek, WS
    Kwon, SC
    [J]. THIN SOLID FILMS, 2002, 410 (1-2) : 107 - 113
  • [2] Field-induced effect in the <111>-oriented 0.70Pb(Mg1/3Nb2/3)O3-0.30PbTiO3 single crystals
    Chen, KP
    Zhang, XW
    Zhao, XY
    Luo, HS
    [J]. MATERIALS LETTERS, 2006, 60 (13-14) : 1634 - 1639
  • [3] Effect of textured LaNiO3 electrode on the fatigue improvement of Pb(Zr0.53Ti0.47)O-3 thin films
    Chen, MS
    Wu, TB
    Wu, JM
    [J]. APPLIED PHYSICS LETTERS, 1996, 68 (10) : 1430 - 1432
  • [4] Correlation between local hysteresis and crystallite orientation in PZT thin films deposited on Si and MgO substrates
    Desfeux, R
    Legrand, C
    Da Costa, A
    Chateigner, D
    Bouregba, R
    Poullain, G
    [J]. SURFACE SCIENCE, 2006, 600 (01) : 219 - 228
  • [5] Coherent ferroelectric switching by atomic force microscopy
    Emelyanov, AY
    [J]. PHYSICAL REVIEW B, 2005, 71 (13)
  • [6] Nanoscale investigations of electrical properties in relaxor Pb(Mg1/3Nb2/3) O3-PbTiO3 thin films deposited on platinum and LaNiO3 electrodes by means of local piezoelectric response
    Ferri, A.
    Da Costa, A.
    Desfeux, R.
    Detalle, M.
    Wang, G. S.
    Remiens, D.
    [J]. INTEGRATED FERROELECTRICS, 2007, 91 : 80 - 96
  • [7] rf-sputtering of PMNT thin films
    Fribourg-Blanc, E
    Cattan, E
    Remiens, D
    Dupont, M
    Osmont, D
    [J]. JOURNAL DE PHYSIQUE IV, 2001, 11 (PR11): : 145 - 149
  • [8] Investigation of Pb(Zr,Ti)O3/GaN heterostructures by scanning probe microscopy
    Gruverman, A
    Cao, W
    Bhaskar, S
    Dey, SK
    [J]. APPLIED PHYSICS LETTERS, 2004, 84 (25) : 5153 - 5155
  • [9] Nanoscale observation of photoinduced domain pinning and investigation of imprint behavior in ferroelectric thin films
    Gruverman, A
    Rodriguez, BJ
    Nemanich, RJ
    Kingon, AI
    [J]. JOURNAL OF APPLIED PHYSICS, 2002, 92 (05) : 2734 - 2739
  • [10] Asymmetric nanoscale switching in ferroelectric thin films by scanning force microscopy
    Gruverman, A
    Kholkin, A
    Kingon, A
    Tokumoto, H
    [J]. APPLIED PHYSICS LETTERS, 2001, 78 (18) : 2751 - 2753
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