Vertical Graphene Growth from Amorphous Carbon Films Using Oxidizing Gases

被引:6
作者
Bachmatiuk, Alicja [1 ,2 ]
Boeckl, John [3 ]
Smith, Howard [3 ,4 ]
Ibrahim, Imad [2 ,5 ]
Gemming, Thomas [2 ,5 ]
Oswald, Steffen [2 ]
Kazmierczak, Wojciech [6 ,7 ]
Makarov, Denys [2 ]
Schmidt, Oliver G. [2 ]
Eckert, Juergen [2 ,5 ]
Fu, Lei [8 ]
Rummeli, Mark H. [9 ,10 ]
机构
[1] Polish Acad Sci, Ctr Polymer & Carbon Mat, PL-41819 Zabrze, Poland
[2] IFW Dresden, D-01171 Dresden, Germany
[3] Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
[4] Univ Dayton, Res Inst, Dayton, OH 45469 USA
[5] Tech Univ Dresden, Ctr Adv Elect Dresden, D-01062 Dresden, Germany
[6] Labsoft Krzysztof Herman, PL-02828 Warsaw, Poland
[7] Tech Univ Dresden, Inst Mat Sci, D-01062 Dresden, Germany
[8] Wuhan Univ, Coll Chem & Mol Sci, Wuhan 430072, Peoples R China
[9] Inst for Basic Sci Korea, IBS Ctr Integrated Nanostruct Phys, Taejon 305701, South Korea
[10] Sungkyunkwan Univ, Dept Phys, Dept Energy Sci, Suwon 440746, South Korea
关键词
CHEMICAL-VAPOR-DEPOSITION; SILICON; TRANSFORMATION; NANOWALLS; NITRIDE;
D O I
10.1021/acs.jpcc.5b05167
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Amorphous carbon thin films are technologically important materials that range in use from the semiconductor industry to corrosion-resistant films. Their conversion to crystalline graphene layers has long been pursued; however, typiCally this requires excessively high temperatures. Thus, crystallization routes which require reduced temperatures are important. Moreover, the ability to crystallize amorphous catbon at reduced, teinpetatures without a catalyst could pave the way for practical graphene synthesis for device fabrication without the need for transfer or post-transfer gate deposition. To this end we demonstrate a practical and facile method to crystallize deposited amorphous Carbon films to high,quality graphene layers at reduced annealing temperatures by introducing oxidizing gases during the process. The reactive gases react with regions of higher strain (energy) in the syStel-n and accelerate the graphitization process by minimizing -criss-cross-linkages and accelerating C-C bond rearrangement at defects. In other words, the movement of crystallite boundaries is accelerated along the carbon hexagon planes by removing obstacles for Crystallite coalescence.
引用
收藏
页码:17965 / 17970
页数:6
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