Testability Design of Multi-valued RTD circuits

被引：0
|
作者：
Lin Mi [1 ]
Zhang Haipeng [1 ]
Sun Lingling [1 ]
机构：
[1] Hangzhou Dianzi Univ, Sch Elect & Informat, Hangzhou, Zhejiang, Peoples R China
来源：
2011 INTERNATIONAL CONFERENCE ON ELECTRONICS, COMMUNICATIONS AND CONTROL (ICECC) | 2011年
关键词：
RTD; multi-valued; short circuit fault; open circuit fault; testability design;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Purpose of the paper is to analyze the physical faults and propose a testability design method for multi-valued RTD circuits based on the stuck faults analysis and stuck faults model, which takes ternary RTD (Resonant Tunneling Diode) quantizer as an example. The test model has a high testability level and low hardware cost which consists of an extra tri-valued inverter circuit and two control ports. By setting different input and testing signals, it generates different testing vectors, which can detect all open circuit faults and short circuit faults.
引用
收藏
页码：510 / 513
页数：4
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