Effects of deposition pressure and plasma power on the growth and properties of boron-doped micro crystalline silicon films

被引:0
|
作者
Chen Yong-Sheng [1 ,2 ]
Yang Shi-E [1 ]
Wang Jian-Hua [3 ]
Lu Jing-Xiao [1 ]
Gao Xiao-Yong [1 ]
Gu Jin-Hua [1 ]
Zheng Wen [1 ]
Zhao Shang-Li [1 ]
机构
[1] Zhengzhou Univ, Dept Phys, Key Lab Mat Phys, Zhengzhou 450052, Peoples R China
[2] Chinese Acad Sci, Inst Plasma Phys, Hefei 230031, Peoples R China
[3] Wuhan Inst Technol, Dept Mat Sci & Engn, Wuhan 430073, Peoples R China
关键词
boron-doped mu c-Si : H films; thin film solar cells; Raman crystallinity; dark conductivity;
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Using diborane as doping gas, p-doped mu c-Si:H layers are deposited by using the plasma enhanced chemical vapour deposition (PECVD) technology. The effects of deposition pressure and plasma power on the growth and the proper-ties of mu c-Si:H layers are investigated. The results show that the deposition rate, the electrical and the structural proper-ties are all strongly dependent on deposition pressure and plasma power. Boron-doped mu c-Si:H films with a dark conductivity as high as 1.42 Omega(-1).cm(-1) and a crystallinity of above 50% are obtained. With this p-layer, mu pc-Si:H solar cells are fabricated. In addition, the mechanism for the effects of deposition pressure and plasma power on the growth and the properties of boron-doped mu c-Si:H layers is discussed.
引用
收藏
页码:1394 / 1399
页数:6
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