High performance HgCdTe-detectors grown by molecular beam epitaxy

被引:0
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作者
Rajavel, RD
Jamba, DM
Jensen, JE
Wu, OK
Cockrum, CA
Wilson, JA
Patten, EA
Rosbeck, KKJ
Goetz, P
Venzor, G
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
摘要
Molecular beam epitaxy (MBE) offers benefits such as the capability for growth of compositionally-tailored heterostructures and in-situ doping of HgCdTe alloys. These capabilities were applied to the growth of long wave infrared unispectral focal plane arrays (FPA) with 480 x 4 elements. The detectivity (D*) map of the FPA demonstrated performance that was higher than the specification value, with no defective channels. Two-color detectors with the n-p-n architecture, for the simultaneous detection of two closely spaced bands in the midwave infrared spectrum were also grown by MBE. These devices exhibited sharp turn-off and turn-on in both bands. The quantum efficiency was greater than 70% and average R(o)A values exceeded 1 x 10(6) Omega-cm(2) in both bands. These result demonstrate that high performance HgCdTe devices can be grown by MBE.
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页码:257 / 262
页数:6
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