Transparent Ru-Si-O/In-Ga-Zn-O MESFETs on Flexible Polymer Substrates

被引:14
|
作者
Kaczmarski, Jakub [1 ]
Taube, Andrzej [1 ,2 ]
Borysiewicz, Michal A. [1 ]
Mysliwiec, Marcin [1 ,2 ]
Piskorski, Krzysztof [1 ]
Stiller, Krystyna [3 ]
Kaminska, Eliana [1 ]
机构
[1] Inst Electr Mat Technol, PL-02668 Warsaw, Poland
[2] Warsaw Univ Technol, Inst Microelect & Optoelect, PL-00662 Warsaw, Poland
[3] Chalmers Univ Technol, Dept Phys, SE-41296 Gothenburg, Sweden
关键词
Amorphous In-Ga-Zn-O (a-IGZO); MESFETs; Ru-Si-O; Schottky barrier; transparent amorphous oxide semiconductors (TAOSs); FIELD-EFFECT TRANSISTORS; THIN-FILM TRANSISTORS; IGZO; CHANNEL; MM;
D O I
10.1109/TED.2017.2658939
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With the development of novel device applications, e.g., in the field of Internet of Things or point-of-care personalized diagnostic systems, came an increased demand for MESFETs for fast and low-power consumption integrated circuits and active-matrix displays. In this paper, we present fabrication and characterization of transparent Ru-Si-O/In-Ga-Zn-O MESFETs on flexible substrates. The use of transparent conducting oxide, namely, Ru-Si-O, as Schottky gate electrode, allows for processing the devices at room temperature, enabling the utilization of such low-temperature substrates as polyethylene terephthalate foil and paper. It was shown that tuning the device geometry allows realization of transistors providing on-current up to 2 mA, while the highest on-to-off current ratio equals 2 x 10(5), with off-current below 1 nA, carrier mobility in the channel exceeds 9 cm(2).V-1.s(-1), and subthreshold swing is below 250 mV.decade(-1).
引用
收藏
页码:129 / 135
页数:7
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