Assessment of paper-based MoS2 FET for Physically Unclonable Functions

被引：5

作者：

Vatalaro, Massimo ^{[1
]}

De Rose, Raffaele ^{[1
]}

Lanuzza, Marco ^{[1
]}

Magnone, Paolo ^{[2
]}

Conti, Silvia ^{[3
]}

Iannaccone, Giuseppe ^{[4
]}

Crupi, Felice ^{[1
]}

机构：

[1] Univ Calabria, DIMES, I-87036 Arcavacata Di Rende, Italy

[2] Univ Padua, Dept Management & Engn, I-36100 Vicenza, Italy

[3] Ist Italiano Tecnol, I-16163 Genoa, Italy

[4] Univ Pisa, Dipartimento Ingn Informaz, I-56122 Pisa, Italy

来源：

SOLID-STATE ELECTRONICS | 2022年 / 194卷

关键词：

2D materials; Paper electronics; Verilog-A model; Hardware security; Physically Unclonable Function (PUF);

D O I：

10.1016/j.sse.2022.108391

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Two-dimensional (2D) materials are recognized as a promising beyond-CMOS technology thanks to their attractive electrical and mechanical properties, which make them particularly suitable for flexible electronics. This work investigates molybdenum disulfide (MoS2) based field-effect transistors (FETs) fabricated on paper substrate to design hardware-security primitives such as Physically Unclonable Functions (PUFs). Circuit simulations have been performed by using a look-up-table (LUT) based Verilog-A model calibrated on electrical measurements of fabricated devices. Obtained results prove the potential of paper-based MoS2 FETs as building blocks for next-generation flexible electronics in the field of hardware security.

引用

页数：8

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