A new sine-fitting algorithm for accurate amplitude and phase measurements in two channel acquisition systems

被引:75
作者
Ramos, Pedro M. [1 ]
Serra, Antonio Cruz [1 ]
机构
[1] Univ Tecn Lisboa, Inst Super Tecn, Dept Elect & Comp Engn, Inst Telecomunicacoes,IST, P-1049001 Lisbon, Portugal
关键词
sine-fitting algorithms; amplitude and phase measurement; digital signal processing algorithms;
D O I
10.1016/j.measurement.2006.03.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Sine-fitting algorithms are very accurate methods to estimate the parameters (amplitude, phase, frequency and DC component) of a digitized sinusoidal signal. In this paper, the standardized algorithms are improved, producing a new algorithm to estimate the sinewave parameters of two acquired sine signals sharing a common frequency. This new algorithm can be used for example in impedance measurements or in the accurate frequency characterization of linear systems by measuring its input and Output and varying the input signal frequency. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:135 / 143
页数:9
相关论文
共 10 条
  • [1] [Anonymous], 10571994 IEEE
  • [2] Four-parameter fitting of sine wave testing result:: iteration and convergence
    Bilau, TZ
    Megyeri, T
    Sárhegyi, A
    Márkus, J
    Kollár, I
    [J]. COMPUTER STANDARDS & INTERFACES, 2004, 26 (01) : 51 - 56
  • [3] A new four parameter sine fitting technique
    da Silva, MF
    Ramos, PM
    Serra, AC
    [J]. MEASUREMENT, 2004, 35 (02) : 131 - 137
  • [4] New methods to improve convergence of sine fitting algorithms
    da Silva, MF
    Serra, AC
    [J]. COMPUTER STANDARDS & INTERFACES, 2003, 25 (01) : 23 - 31
  • [5] *IEEE, 2001, 12412000 IEEE
  • [6] KRUMPHOLC M, 2005, 14 S NEW TECHN MEAS, P229
  • [7] RADIL T, 2005, IMTC 2005 INSTR MEAS, P1018
  • [8] Low frequency impedance measurement using sine-fitting
    Ramos, PM
    da Silva, MF
    Serra, AC
    [J]. MEASUREMENT, 2004, 35 (01) : 89 - 96
  • [9] THE INTERPOLATED FAST FOURIER-TRANSFORM - A COMPARATIVE-STUDY
    SCHOUKENS, J
    PINTELON, R
    VANHAMME, H
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (02) : 226 - 232
  • [10] ZHANG JQ, 1997, IEEE T INSTRUM MEAS, V46, P1026