Group-IV midinfrared plasmonics

被引:30
作者
Biagioni, Paolo [1 ]
Frigerio, Jacopo [2 ]
Samarelli, Antonio [3 ]
Gallacher, Kevin [3 ]
Baldassarre, Leonetta [4 ]
Sakat, Emilie [1 ]
Calandrini, Eugenio [5 ]
Millar, Ross W. [3 ]
Giliberti, Valeria [5 ]
Isella, Giovanni [2 ]
Paul, Douglas J. [3 ]
Ortolani, Michele [5 ]
机构
[1] Politecn Milan, Dipartimento Fis, I-20133 Milan, Italy
[2] Politecn Milan, Dipartimento Fis, LNESS, I-22100 Como, Italy
[3] Univ Glasgow, Sch Engn, Glasgow G12 8LT, Lanark, Scotland
[4] Ist Italiano Tecnol, Ctr Life Nano Sci Sapienza, I-00161 Rome, Italy
[5] Univ Roma La Sapienza, Dipartimento Fis, I-00185 Rome, Italy
关键词
plasmonics; midinfrared; silicon photonics; group-IV semiconductors; germanium; CHEMICAL-VAPOR-DEPOSITION; ENERGY; PHOTONICS; SILICON; NANOANTENNAS;
D O I
10.1117/1.JNP.9.093789
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The use of heavily doped semiconductors to achieve plasma frequencies in the mid-IR has been recently proposed as a promising way to obtain high-quality and tunable plasmonic materials. We introduce a plasmonic platform based on epitaxial n-type Ge grown on standard Si wafers by means of low-energy plasma-enhanced chemical vapor deposition. Due to the large carrier concentration achieved with P dopants and to the compatibility with the existing CMOS technology, SiGe plasmonics hold promises for mid-IR applications in optoelectronics, IR detection, sensing, and light harvesting. As a representative example, we show simulations of mid-IR plasmonic waveguides based on the experimentally retrieved dielectric constants of the grown materials. (C) The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License.
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页数:6
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