Phase retrieval of an electron vortex beam using diffraction holography

被引:4
作者
Venturi, Federico [1 ,2 ]
Campanini, Marco [3 ,9 ]
Gazzadi, Gian Carlo [2 ]
Balboni, Roberto [4 ]
Frabboni, Stefano [1 ,2 ]
Boyd, Robert W. [5 ,6 ]
Dunin-Borkowski, Rafal E. [7 ]
Karimi, Ebrahim [5 ,8 ]
Grillo, Vincenzo [2 ,3 ]
机构
[1] Univ Modena & Reggio Emilia, Dipartimento FIM, Via G Campi 213-A, I-41125 Modena, Italy
[2] CNR, Ist Nanosci, Ctr S3, Via G Campi 213-A, I-41125 Modena, Italy
[3] CNR, IMEM, Parco Area Sci 37-A, I-43124 Parma, Italy
[4] CNR, IMM Bologna, Via P Gobetti 101, I-40129 Bologna, Italy
[5] Univ Ottawa, Dept Phys, 25 Templeton St, Ottawa, ON K1N 6N5, Canada
[6] Univ Rochester, Inst Opt, Rochester, NY 14627 USA
[7] Forschungszentrum Julich, Electrons & Peter Grunberg Inst, Ernst Ruska Ctr Microscopy & Spect, D-52425 Julich, Germany
[8] Inst Adv Studies Basic Sci, Dept Phys, Zanjan 4513766731, Iran
[9] EMPA, Uberlandstr 129, CH-8600 Zurich, Switzerland
基金
欧洲研究理事会;
关键词
ORBITAL ANGULAR-MOMENTUM; MICROSCOPY; RESOLUTION; INTERFEROMETRY; INTERFERENCE; GENERATION;
D O I
10.1063/1.4998595
中图分类号
O59 [应用物理学];
学科分类号
摘要
In both light optics and electron optics, the amplitude of a wave scattered by an object is an observable that is usually recorded in the form of an intensity distribution in a real space image or a diffraction image. In contrast, retrieval of the phase of a scattered wave is a well-known challenge, which is usually approached by interferometric or numerical methods. In electron microscopy, as a result of constraints in the lens setup, it is particularly difficult to retrieve the phase of a diffraction image. Here, we use a "defocused beam" generated by a nanofabricated hologram to form a reference wave that can be interfered with a diffracted beam. This setup provides an extended interference region with the sample wavefunction in the Fraunhofer plane. As a case study, we retrieve the phase of an electron vortex beam. Beyond this specific example, the approach can be used to retrieve the wavefronts of diffracted beams from a wide range of samples. Published by AIP Publishing.
引用
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页数:5
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