Effect of TiON-MgO intermediate layer on microstructure and magnetic properties of L10 FePt-C-SiO2 films

被引:19
作者
Deng, J. Y. [1 ]
Dong, K. F. [2 ]
Peng, Y. G. [3 ]
Ju, G. P. [3 ]
Hu, J. F. [4 ]
Chow, G. M. [1 ]
Chen, J. S. [1 ]
机构
[1] Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 117576, Singapore
[2] China Univ Geosci, Sch Automat, Wuhan 430074, Peoples R China
[3] Seagate Technol, Fremont, CA 94538 USA
[4] DSI, Singapore 117608, Singapore
基金
新加坡国家研究基金会;
关键词
FePt HAMR;
D O I
10.1016/j.jmmm.2016.05.096
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The microstructure and magnetic properties of L1(0) FePt-C-SiO2 films grown on TiON-MgO intermediate layer were studied. TiON-MgO layer was deposited by co-sputtering TiN and MgO-TiO2 targets at 380 degrees C. With increasing MgO-TiO2 doping concentration, the contact angle between FePt grains with intermediate layer gradually increased, and it was close to 90 degrees when the volume percentage of MgO-TiO2 reached 30%. At this condition, a high out-of-plane coercivity of 19.1 kOe was obtained, while the opening-up of in-plane M-H loop was very narrow. Moreover, it was found that the out-of-plane coercivity can be further improved to 21.6 kOe, by slightly increasing the percentage of MgO-TiO2 to 35 vol%. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:203 / 207
页数:5
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