Morphological and optical properties of low temperature processed SnO2:F

被引:10
作者
Uprety, Prakash [1 ,2 ]
Lambright, Kelly J. [3 ]
Grice, Corey R. [1 ,2 ]
Junda, Maxwell M. [1 ,2 ]
Giolando, Dean M. [3 ]
Podraza, Nikolas J. [1 ,2 ]
机构
[1] Univ Toledo, Dept Phys & Astron, Toledo, OH 43606 USA
[2] Univ Toledo, Wright Ctr Photovolta Innovat & Commercializat, Toledo, OH 43606 USA
[3] Univ Toledo, Dept Chem & Biochem, Toledo, OH 43606 USA
来源
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2017年 / 254卷 / 10期
关键词
complex dielectric function; optical properties; spectroscopic ellipsometry; tin oxide; DOPED TIN OXIDE; STOKES VECTOR SPECTROSCOPY; SPRAY-DEPOSITED FLUORINE; THIN-FILMS; ELECTRICAL-PROPERTIES; SURFACE-ROUGHNESS; ELLIPSOMETRY; PRECURSOR;
D O I
10.1002/pssb.201700102
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Thin films of transparent conducting fluorine doped tin oxide (SnO2:F) on soda lime glass and stainless steel substrates are prepared by spray pyrolysis at low temperature 250 degrees C. Optical properties in the form of complex dielectric function (E=E-1+iE(2)) spectra are obtained using spectroscopic ellipsometry from 0.035 to 5.89eV for SnO2:F on glass and from 0.75 to 5.89eV for SnO2:F on stainless steel. The absorption coefficient () spectra are extracted from spectra in E for the film on soda lime glass from 0.035 to 5.89eV and on stainless steel from 0.75 to 5.89eV. Direct band gaps for SnO2:F thin films on soda lime glass and stainless steel substrates are determined to be 3.45 +/- 0.01 and 3.60 +/- 0.01eV, respectively. Infrared extended measurement shows an absorption feature at 0.063eV (508cm(-1)) which may be attributed to Sn-O and Sn-F bonding. A broad background phonon absorption feature due to Sn-OH and O-H bonding is also identified at 0.3eV (2420cm(-1)). Resistivity is deduced from E. Improved agreement between optically and electrically determined resistivity is obtained when the infrared range spectrum is analyzed. The morphologies of both the films are studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM). (C) 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
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页数:9
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