Investigation of the phase shift in X-ray forward diffraction using an X-ray interferometer

被引:1
|
作者
Hirano, K
Momose, A
机构
[1] High Energy Accelerator Res Org, Inst Mat Struct Sci, Tsukuba, Ibaraki 305, Japan
[2] Hitachi Ltd, Adv Res Lab, Hatoyama, Saitama 35003, Japan
关键词
X-ray diffraction; forward diffraction; phase shifts; X-ray interferometer;
D O I
10.1107/S0909049597015525
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The phase shift of forward-diffracted X-rays by a perfect crystal is discussed on the basis of the dynamical theory of X-ray diffraction. By means of a triple Laue-case X-ray interferometer, the phase shift of forward-diffracted X-rays by a silicon crystal in the Bragg geometry was investigated.
引用
收藏
页码:967 / 968
页数:2
相关论文
共 50 条
  • [21] THE TECHNIQUE OF X-RAY DIFFRACTION INVESTIGATION OF CRYSTAL AGGREGATES
    Panchenko, A. V.
    Tolstykh, N. D.
    Gromilov, S. A.
    JOURNAL OF STRUCTURAL CHEMISTRY, 2014, 55 (07) : 1209 - 1214
  • [22] X-ray diffraction investigation of electrochemically deposited copper
    Pantleon, K
    Jensen, JD
    Somers, MAJ
    EUROPEAN POWDER DIFFRACTION EPDIC 8, 2004, 443-4 : 201 - 204
  • [23] The technique of X-ray diffraction investigation of crystal aggregates
    A. V. Panchenko
    N. D. Tolstykh
    S. A. Gromilov
    Journal of Structural Chemistry, 2014, 55 : 1209 - 1214
  • [24] Classification of counterfeit coins using multivariate analysis with X-ray diffraction and X-ray fluorescence methods
    Hida, M
    Sato, H
    Sugawara, H
    Mitsui, T
    FORENSIC SCIENCE INTERNATIONAL, 2001, 115 (1-2) : 129 - 134
  • [25] Characterization of AlInN/AlN/GaN FET structures using x-ray diffraction, x-ray reflectometry and grazing incidence x-ray fluorescence analysis
    Lesnik, Andreas
    Blaesing, Juergen
    Hennig, Jonas
    Dadgar, Armin
    Krost, Alois
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2014, 47 (35)
  • [26] Structural Characterization of Gallbladder Stones Using Energy Dispersive X-ray Spectroscopy and X-ray Diffraction
    Almarshad, Hassan A.
    Badawy, Sayed M.
    Alsharari, Abdalkarem F.
    COMBINATORIAL CHEMISTRY & HIGH THROUGHPUT SCREENING, 2018, 21 (07) : 495 - 500
  • [27] X-ray phase imaging of a packaged IC chip using X-ray array source
    Park, Y.
    Choi, J.
    IEICE ELECTRONICS EXPRESS, 2010, 7 (16): : 1182 - 1187
  • [28] In situ X-ray absorption spectroscopy and X-ray diffraction of fuel cell electrocatalysts
    Russell, AE
    Maniguet, S
    Mathew, RJ
    Yao, J
    Roberts, MA
    Thompsett, D
    JOURNAL OF POWER SOURCES, 2001, 96 (01) : 226 - 232
  • [29] Quantitative X-ray diffraction and X-ray fluorescence analyses of mixtures - unified and simplified
    Chung, Frank H.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2018, 51 : 789 - 795
  • [30] Determination of quartz in bauxite by a combined X-ray diffraction and X-ray fluorescence method
    Feret, FR
    Roy, D
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2002, 57 (03) : 551 - 559