Investigation of the phase shift in X-ray forward diffraction using an X-ray interferometer

被引：1
|
作者：
Hirano, K
Momose, A
机构：
[1] High Energy Accelerator Res Org, Inst Mat Struct Sci, Tsukuba, Ibaraki 305, Japan
[2] Hitachi Ltd, Adv Res Lab, Hatoyama, Saitama 35003, Japan
来源：
JOURNAL OF SYNCHROTRON RADIATION | 1998年 / 5卷
关键词：
X-ray diffraction; forward diffraction; phase shifts; X-ray interferometer;
D O I：
10.1107/S0909049597015525
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The phase shift of forward-diffracted X-rays by a perfect crystal is discussed on the basis of the dynamical theory of X-ray diffraction. By means of a triple Laue-case X-ray interferometer, the phase shift of forward-diffracted X-rays by a silicon crystal in the Bragg geometry was investigated.
引用
收藏
页码：967 / 968
页数：2
相关论文
共 50 条
  • [1] Phase Imaging with a Phase-Shifting X-ray Shearing Interferometer Using an X-ray Line Source
    Koichi Iwata
    Atsuo Kawasaki
    Hisao Kikuta
    Optical Review, 2000, 7 : 561 - 565
  • [2] Phase imaging with a phase-shifting X-ray shearing interferometer using an X-ray line source
    Iwata, K
    Kawasaki, A
    Kikuta, H
    OPTICAL REVIEW, 2000, 7 (06) : 561 - 565
  • [3] Project for applications of phase-contrast X-ray imaging to medicine using an X-ray interferometer
    Momose, A
    Yoneyama, A
    Takeda, T
    Itai, Y
    Tu, J
    Hirano, K
    MEDICAL APPLICATIONS OF PENETRATING RADIATION, 1999, 3770 : 23 - 31
  • [4] X-ray diffraction by phase diffraction gratings
    Irzhak, D. V.
    Knyasev, M. A.
    Punegov, V. I.
    Roshchupkin, D. V.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2015, 48 : 1159 - 1164
  • [5] Investigation of supported nickel catalysts by X-ray absorption spectrometry and X-ray diffraction using synchrotron radiation
    Aldea, N
    Gluhoi, A
    Marginean, P
    Cosma, C
    Xie, YN
    Hu, TD
    Tao, L
    Wu, ZH
    Dong, BZ
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2002, 57 (09) : 1453 - 1460
  • [6] Development of an X-ray interferometer for high-resolution phase-contrast X-Ray imaging
    Hirano, K
    Momose, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1999, 38 (12B): : L1556 - L1558
  • [7] Investigation of residual stresses in microsystems using X-ray diffraction
    Kämpfe, B
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2000, 288 (02): : 119 - 125
  • [8] Structural investigation of GaInP nanowires using X-ray diffraction
    Kriegner, D.
    Persson, J. M.
    Etzelstorfer, T.
    Jacobsson, D.
    Wallentin, J.
    Wagner, J. B.
    Deppert, K.
    Borgstrom, M. T.
    Stangl, J.
    THIN SOLID FILMS, 2013, 543 : 100 - 105
  • [9] Phase-Shifting,X-Ray shearing interferometer
    Iwata, K
    Kikuta, H
    Tadano, H
    Hagino, H
    Nakano, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (11): : 6535 - 6539
  • [10] Chemical and Structural Analysis of Rocks Using X-ray Fluorescence and X-ray Diffraction Techniques
    Sabri, Mohammed M.
    ARO-THE SCIENTIFIC JOURNAL OF KOYA UNIVERSITY, 2020, 8 (01): : 79 - 87
12345