Elemental analysis of thin films by neutron depth profiling.

被引：0
|
作者：
Lamaze, GP [1 ]
Chen-Mayer, HH [1 ]
机构：
[1] Natl Inst Stand & Technol, Div Analyt Chem, Gaithersburg, MD 20899 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2000年 / 220卷
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D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
117-NUCL
引用
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页码：U20 / U20
页数：1
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