A new neutron interferometric method used to measure the scattering length of silicon

被引：2
|
作者：
Ioffe, A
Jacobson, D
Arif, M
Vrana, M
Werner, SA
Fischer, P
Greene, G
Mezei, F
机构：
[1] Hahn Meitner Inst, Berlin Neutron Scattering Ctr, D-14109 Berlin, Germany
[2] St Petersburg Nucl Phys Inst, Gatchina 188350, Russia
[3] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
[4] CAS, Inst Phys Nucl, Rez 20568, Czech Republic
[5] Univ Missouri, Dept Phys & Astron, Columbia, MO 65211 USA
[6] Univ Calif Los Alamos Natl Lab, Los Alamos, NM USA
来源：
PHYSICA B | 1997年 / 241卷
关键词：
neutron interferometry; coherent scattering length; silicon;
D O I：
10.1016/S0921-4526(97)00866-1
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The neutron interferometry technique provides a precise and direct way to measure the coherent scattering lengths b of low-energy neutrons, but its potential accuracy has not been fully realized in past experiments due to systematic sources of error. We have used a new method, which eliminates two of the main sources of error, to measure the scattering length of silicon to an accuracy of 0.005%. The resulting value b = 4.1507(2) fm is in agreement with the current accepted value, but has an error limit five times lower. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：130 / 132
页数：3
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