Accurate H-atom parameters from X-ray diffraction data

被引：15
|
作者：
Farrugia, Louis J. [1 ]
机构：
[1] Univ Glasgow, Sch Chem, Glasgow G12 8QQ, Lanark, Scotland
来源：
IUCRJ | 2014年 / 1卷
关键词：
D O I：
10.1107/S2052252514018612
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：265 / 266
页数：2
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