Electron-impact ionization of singly-charged neon ions

被引：8

作者：

Lecointre, J. ^{[1
]}

Jureta, J. J. ^{[1
,2
]}

Defrance, P. ^{[1
]}

机构：

[1] Catholic Univ Louvain, Dept Phys, Unite PAMO, B-1348 Louvain, Belgium

[2] Inst Phys, Belgrade 11081, Serbia

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2008年 / 41卷 / 09期

关键词：

D O I：

10.1088/0953-4075/41/9/095204

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Absolute cross sections for electron-impact single and multiple ionization of Ne+ leading to the formation of Neq+ (q = 2-5) are reported. The animated crossed beams method is applied in the energy range from the respective thresholds up to 2.5 keV. The maximum cross sections are found to be (4.12 +/- 0.21) x 10(-17) cm(2), (1.42 +/- 0.07) x 10(18) cm(2), (2.57 +/- 0.14) x 10(-20) cm(2), (8.78 +/- 0.54) x 10(-22) cm(2) for the multiply-charged products Neq+ (q = 2-5), respectively. The corresponding threshold energies are measured to be (41.0 +/- 0.5) eV, (105 +/- 1) eV, (205 +/- 5) eV and (345 +/- 15) eV. Present data are compared with available experimental and theoretical results.

引用

页数：7