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Electron-impact ionization of singly-charged neon ions
被引:8
|作者:
Lecointre, J.
[1
]
Jureta, J. J.
[1
,2
]
Defrance, P.
[1
]
机构:
[1] Catholic Univ Louvain, Dept Phys, Unite PAMO, B-1348 Louvain, Belgium
[2] Inst Phys, Belgrade 11081, Serbia
关键词:
D O I:
10.1088/0953-4075/41/9/095204
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
Absolute cross sections for electron-impact single and multiple ionization of Ne+ leading to the formation of Neq+ (q = 2-5) are reported. The animated crossed beams method is applied in the energy range from the respective thresholds up to 2.5 keV. The maximum cross sections are found to be (4.12 +/- 0.21) x 10(-17) cm(2), (1.42 +/- 0.07) x 10(18) cm(2), (2.57 +/- 0.14) x 10(-20) cm(2), (8.78 +/- 0.54) x 10(-22) cm(2) for the multiply-charged products Neq+ (q = 2-5), respectively. The corresponding threshold energies are measured to be (41.0 +/- 0.5) eV, (105 +/- 1) eV, (205 +/- 5) eV and (345 +/- 15) eV. Present data are compared with available experimental and theoretical results.
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页数:7
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