Imaging light scattered by a subwavelength nanofiber, from near field to far field

被引：4

作者：

Loo, Vivien ^{[1
]}

Blanquer, Guillaume ^{[1
]}

Joos, Maxime ^{[2
]}

Glorieux, Quentin ^{[2
]}

De Wilde, Yannick ^{[1
]}

Krachmalnicoff, Valentina ^{[1
]}

机构：

[1] PSL Univ, Inst Langevin, ESPCI Paris, CNRS, 1 Rue Jussieu, F-75005 Paris, France

[2] ENS PSL Univ, Lab Kastler Brossel, Sorbonne Univ, CNRS,Coll France, F-75005 Paris, France

来源：

OPTICS EXPRESS | 2019年 / 27卷 / 02期

关键词：

DIAMETER SILICA; EMITTERS; DENSITY; STATES; BEAM;

D O I：

10.1364/OE.27.000350

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a direct experimental investigation of the optical field distribution around a suspended tapered optical nanofiber by means of a fluorescent scanning probe. Using a 100 nm diameter fluorescent bead as a probe of the field intensity, we study interferences made by a nanofiber (400 nm diameter) scattering a plane wave (568 nm wavelength). Our scanning fluorescence near-field microscope maps the optical field over 36 mu m(2), with lambda/5 resolution, from contact with the surface of the nanofiber to a few micrometers away. Comparison between experiments and Mie scattering theory allows us to precisely determine the emitter-nanofiber distance and experimental drifts. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

引用

页码：350 / 357

页数：8

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