An ASIC for the Study of Charge Sharing Effects in Small Pixel CdZnTe X-Ray Detectors

被引:38
|
作者
Veale, Matthew C. [1 ]
Bell, Steven J. [1 ]
Jones, Lawrence L. [1 ]
Seller, Paul [1 ]
Wilson, Matthew D. [1 ]
Allwork, Christopher [2 ]
Kitou, Dimitris [2 ]
Sellin, Paul J. [2 ]
Veeramani, Perumal [2 ]
Cernik, Robert C. [3 ]
机构
[1] Rutherford Appleton Lab, Sci & Technol Facil Council, Chilton OX11 0QX, Oxon, England
[2] Univ Surrey, Guildford GU2 7XH, Surrey, England
[3] Univ Manchester, Sch Mat Sci, Manchester M1 7HS, Lancs, England
基金
英国工程与自然科学研究理事会;
关键词
ASIC; CdZnTe; characterization; charge sharing; small pixel effect;
D O I
10.1109/TNS.2011.2162746
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An Application Specific Integrated Circuit (ASIC) has been developed at the Rutherford Appleton Laboratory (RAL) to study the small pixel effect in spectroscopic CdTe and CdZnTe detectors. The PIXIE ASIC consists of four arrays of 3 x 3 channels flip chip bonded directly to the detector pixels. The active circuitry of each channel is a charge sensitive preamplifier and an output buffer which is multiplexed directly off chip. Each of the four detector arrays has a different anode geometry. The HEXITEC series of small pixel detectors developed at RAL have demonstrated energy resolutions of similar to 1 keV per pixel for both CdTe and CdZnTe, however, charge sharing events account for between 30-40% of the total count rate and can lead to degradation of the spectroscopy if not corrected for. The PIXIE ASIC will be used to study the effect of anode geometry on charge sharing and other aspects of the small pixel effect.
引用
收藏
页码:2357 / 2362
页数:6
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