Self-regulation of Bi/(Bi plus Fe) ratio in metalorganic chemical vapor deposition of BiFeO3 thin films

被引:5
|
作者
Fujisawa, Hironori [1 ,2 ,3 ]
Yoshimura, Nao [1 ]
Nakashima, Seiji [1 ,2 ,3 ]
Shimizu, Masaru [1 ,2 ]
机构
[1] Univ Hyogo, Grad Sch Engn, Dept Elect & Comp Sci, Himeji, Hyogo 6712280, Japan
[2] Univ Hyogo, Grad Sch Engn, Res Ctr Nanomicro Struct Sci & Engn, Himeji, Hyogo 6712280, Japan
[3] Univ Hyogo, Adv Med Engn Ctr, Himeji, Hyogo 6712280, Japan
关键词
FERROELECTRIC PROPERTIES; ELECTRICAL-PROPERTIES; DOMAIN-WALLS; POLARIZATION; GROWTH; MOCVD; PHASE;
D O I
10.7567/JJAP.56.10PF05
中图分类号
O59 [应用物理学];
学科分类号
摘要
Metalorganic chemical vapor deposition (MOCVD) is one of the suitable techniques for practical applications of BiFeO3 films. To develop the potential of MOCVD as a device fabrication process, we investigated the relationship between the film and gas compositions, and the growth under highly oxidizing conditions using O-2 and O-3 gases. In the growth of epitaxial BiFeO3 thin films on SrRuO3-covered 4 degrees vicinal SrTiO3(001) at 620 degrees C, the self-regulation of the film composition was achieved for Bi and Fe precursor supply ratios between 62.1 to 78.5% under O-2 and 56.1 to 73.2% under 5 wt% O-3-mixed O-2 atmospheres. The leakage was very sensitive to the precursor supply ratio and oxidizing gas. 150-nm-thick MOCVD-BiFeO3 films grown using O-2+O-3 gas showed the minimum leakage current density of 2.3 x 10(-7) A/cm(2) at +1V. The highly oxidizing growth conditions using O-3 can suppress the leakage while precise composition control is required. (C) 2017 The Japan Society of Applied Physics
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页数:5
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