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- [31] Improvement of Ferroelectricity in Ce-Doped Hf0.5Zr0.5O2 Thin FilmsCOATINGS, 2022, 12 (11)Xiao, Yong-Guang论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Hunan Prov Key Lab Thin Film Mat & Devices, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R ChinaLiu, Si-Wei论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Hunan Prov Key Lab Thin Film Mat & Devices, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R ChinaYang, Li-Sha论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Hunan Prov Key Lab Thin Film Mat & Devices, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R ChinaJiang, Yong论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Hunan Prov Key Lab Thin Film Mat & Devices, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R ChinaXiong, Ke论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Hunan Prov Key Lab Thin Film Mat & Devices, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R ChinaLi, Gang论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Hunan Prov Key Lab Thin Film Mat & Devices, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R ChinaOuyang, Jun论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Hunan Prov Key Lab Thin Film Mat & Devices, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R ChinaTang, Ming-Hua论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Hunan Prov Key Lab Thin Film Mat & Devices, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Key Lab Key Film Mat & Applicat Equipments Hunan P, Xiangtan 411105, Peoples R China
- [32] Effect of a ZrO2 Seed Layer on an Hf0.5Zr0.5O2 Ferroelectric Device Fabricated via Plasma Enhanced Atomic Layer DepositionMATERIALS, 2023, 16 (05)Song, Ji-Na论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Korea, Dept Adv Mat Engn, Siheung Si 15073, Gyeonggi Do, South Korea Tech Univ Korea, Dept Adv Mat Engn, Siheung Si 15073, Gyeonggi Do, South KoreaOh, Min-Jung论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Korea, Dept Adv Mat Engn, Siheung Si 15073, Gyeonggi Do, South Korea Tech Univ Korea, Dept Adv Mat Engn, Siheung Si 15073, Gyeonggi Do, South KoreaYoon, Chang-Bun论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Korea, Dept Adv Mat Engn, Siheung Si 15073, Gyeonggi Do, South Korea Tech Univ Korea, Dept Adv Mat Engn, Siheung Si 15073, Gyeonggi Do, South Korea
- [33] Improving the ferroelectric properties of Lu doped Hf0.5Zr0.5O2 thin films by capping a CeO x layerNANOTECHNOLOGY, 2024, 35 (38)Xiao, Yongguang论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaYang, Lisha论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaJiang, Yong论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaLiu, Siwei论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaLi, Gang论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaOuyang, Jun论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China Qilu Univ Technol, Shandong Acad Sci, Jinan 250353, Shandong, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaTang, Minghua论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
- [34] Ferroelectric properties and switching endurance of Hf0.5Zr0.5O2 films on TiN bottom and TiN or RuO2 top electrodesPHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2014, 8 (06): : 532 - 535Park, Min Hyuk论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaKim, Han Joon论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaKim, Yu Jin论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaJeon, Woojin论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaMoon, Taehwan论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaHwang, Cheol Seong论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea
- [35] Growth and structural characterization of strained epitaxial Hf0.5Zr0.5O2 thin filmsPHYSICAL REVIEW MATERIALS, 2018, 2 (01):Torrejon, Luis论文数: 0 引用数: 0 h-index: 0机构: Univ Zaragoza, Inst Nanociencia Aragon, Zaragoza 50018, Spain Univ Zaragoza, Inst Nanociencia Aragon, Zaragoza 50018, SpainLangenberg, Eric论文数: 0 引用数: 0 h-index: 0机构: Univ Zaragoza, CSIC, Inst Ciencia Mat Aragon, E-50009 Zaragoza, Spain Univ Zaragoza, Dept Fis Mat Condensada, E-50009 Zaragoza, Spain Univ Zaragoza, Inst Nanociencia Aragon, Zaragoza 50018, SpainMagen, Cesar论文数: 0 引用数: 0 h-index: 0机构: Univ Zaragoza, CSIC, Inst Ciencia Mat Aragon, E-50009 Zaragoza, Spain Univ Zaragoza, Dept Fis Mat Condensada, E-50009 Zaragoza, Spain Univ Zaragoza, Inst Nanociencia Aragon, Lab Microscopias Avanzadas, Zaragoza 50018, Spain Univ Zaragoza, Inst Nanociencia Aragon, Zaragoza 50018, SpainLarrea, Angel论文数: 0 引用数: 0 h-index: 0机构: Univ Zaragoza, CSIC, Inst Ciencia Mat Aragon, E-50009 Zaragoza, Spain Univ Zaragoza, Inst Nanociencia Aragon, Zaragoza 50018, SpainBlasco, Javier论文数: 0 引用数: 0 h-index: 0机构: Univ Zaragoza, CSIC, Inst Ciencia Mat Aragon, E-50009 Zaragoza, Spain Univ Zaragoza, Dept Fis Mat Condensada, E-50009 Zaragoza, Spain Univ Zaragoza, Inst Nanociencia Aragon, Zaragoza 50018, SpainSantiso, Jose论文数: 0 引用数: 0 h-index: 0机构: Barcelona Inst Sci & Technol, CSIC, Catalan Inst Nanosci & Nanotechnol ICN2, Campus UAB, Barcelona, Spain Univ Zaragoza, Inst Nanociencia Aragon, Zaragoza 50018, SpainAlgarabel, Pedro A.论文数: 0 引用数: 0 h-index: 0机构: Univ Zaragoza, CSIC, Inst Ciencia Mat Aragon, E-50009 Zaragoza, Spain Univ Zaragoza, Dept Fis Mat Condensada, E-50009 Zaragoza, Spain Univ Zaragoza, Inst Nanociencia Aragon, Zaragoza 50018, SpainPardo, Jose A.论文数: 0 引用数: 0 h-index: 0机构: Univ Zaragoza, Inst Nanociencia Aragon, Zaragoza 50018, Spain Univ Zaragoza, Inst Nanociencia Aragon, Lab Microscopias Avanzadas, Zaragoza 50018, Spain Univ Zaragoza, Dept Ciencia & Tecnol Mat & Fluidos, Zaragoza 50018, Spain Univ Zaragoza, Inst Nanociencia Aragon, Zaragoza 50018, Spain
- [36] Origin of the retention loss in ferroelectric Hf0.5Zr0.5O2-based memory devicesACTA MATERIALIA, 2021, 204Chouprik, Anastasia论文数: 0 引用数: 0 h-index: 0机构: Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, Russia Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, RussiaKondratyuk, Ekaterina论文数: 0 引用数: 0 h-index: 0机构: Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, Russia Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, RussiaMikheev, Vitalii论文数: 0 引用数: 0 h-index: 0机构: Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, Russia Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, RussiaMatveyev, Yury论文数: 0 引用数: 0 h-index: 0机构: DESY, 85 Notkestr, D-22607 Hamburg, Germany Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, RussiaSpiridonov, Maxim论文数: 0 引用数: 0 h-index: 0机构: Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, Russia Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, RussiaChernikova, Anna论文数: 0 引用数: 0 h-index: 0机构: Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, Russia Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, RussiaKozodaev, Maxim G.论文数: 0 引用数: 0 h-index: 0机构: Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, Russia Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, RussiaMarkeev, Andrey M.论文数: 0 引用数: 0 h-index: 0机构: Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, Russia Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, RussiaZenkevich, Andrei论文数: 0 引用数: 0 h-index: 0机构: Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, Russia Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, RussiaNegrov, Dmitrii论文数: 0 引用数: 0 h-index: 0机构: Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, Russia Moscow Inst Phys & Technol, 9 Inst Skiy Lane, Dolgoprudnyi 141700, Moscow Region, Russia
- [37] Metal Interlayer Insertion for Grain Engineering in Ferroelectric Hf0.5Zr 0.5O2IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (11) : 6647 - 6651Nguyen, Anh-Duy论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, 3D Convergence Ctr, Incheon 22212, South Korea Inha Univ, Dept Mat Sci & Engn, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaSong, Si-Un论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, Dept Mat Sci & Engn, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaNguyen, An Hoang Thuy论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, 3D Convergence Ctr, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaNguyen, Cuong-Manh论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, 3D Convergence Ctr, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaHong, Ye-Eun论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, Dept Mat Sci & Engn, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaHam, Yeongshin论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, Dept Mat Sci & Engn, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaKim, Jae-Kyeong论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, Programin Semicond Convergence, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaBaek, Jong-Hwa论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, Dept Mat Sci & Engn, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaHwang, Kyungsoo论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, Dept Mat Sci & Engn, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaPark, Geon论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, Programin Semicond Convergence, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaKim, Hyun Soo论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, Programin Semicond Convergence, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaSin, Hoyeon论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, 3D Convergence Ctr, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South KoreaChoi, Rino论文数: 0 引用数: 0 h-index: 0机构: Inha Univ, 3D Convergence Ctr, Incheon 22212, South Korea Inha Univ, Programin Semicond Convergence, Incheon 22212, South Korea Inha Univ, 3D Convergence Ctr, Incheon 22212, South Korea
- [38] Toward Low-Thermal-Budget Processing in Ferroelectric Hf0.5Zr0.5O2 Thin Films by Ozone Interface OxidationIEEE ELECTRON DEVICE LETTERS, 2023, 44 (12) : 1959 - 1962Tai, Lu论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R ChinaWei, Wei论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R ChinaJiang, Pengfei论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R ChinaSang, Pengpeng论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R ChinaLi, Xiaopeng论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R ChinaZhao, Guoqing论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R ChinaDou, Xiaoyu论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R ChinaZhan, Xuepeng论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R ChinaLuo, Qing论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R ChinaWu, Jixuan论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R ChinaChen, Jiezhi论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R China Shandong Univ, Sch Informat Sci & Engn ISE, Qingdao 266237, Peoples R China
- [39] Ferroelectric-driven disorder inducing transition of bosonic insulator-superconductor in TiN/Hf0.5Zr0.5O2 heterojunctionAPPLIED PHYSICS LETTERS, 2023, 123 (21)Han, Qilin论文数: 0 引用数: 0 h-index: 0机构: Henan Univ, Sch Future Technol, Zhengzhou 450046, Peoples R China Henan Univ, Sch Future Technol, Zhengzhou 450046, Peoples R ChinaKang, Chaoyang论文数: 0 引用数: 0 h-index: 0机构: Henan Univ, Sch Future Technol, Zhengzhou 450046, Peoples R China Henan Univ, Sch Future Technol, Zhengzhou 450046, Peoples R ChinaChen, Xuegang论文数: 0 引用数: 0 h-index: 0机构: Anhui Univ, Informat Mat & Intelligent Sensing Lab Anhui Prov, Key Lab Struct & Funct Regulat Hybrid Mat, Minist Educ, Hefei 230601, Peoples R China Henan Univ, Sch Future Technol, Zhengzhou 450046, Peoples R ChinaWang, Kai论文数: 0 引用数: 0 h-index: 0机构: Henan Univ, Sch Future Technol, Zhengzhou 450046, Peoples R China Henan Univ, Sch Future Technol, Zhengzhou 450046, Peoples R ChinaZhang, Weifeng论文数: 0 引用数: 0 h-index: 0机构: Henan Univ, Sch Future Technol, Zhengzhou 450046, Peoples R China Henan Acad Sci, Inst Quantum Mat & Phys, Zhengzhou 450046, Peoples R China Henan Univ, Sch Future Technol, Zhengzhou 450046, Peoples R China
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