共 2 条
Analysis and Techniques for Mitigating Interference From Power/Signal Lines and to SRAM Circuits in CMOS Inductive-Coupling Link for Low-Power 3-D System Integration
被引:11
|作者:
Niitsu, Kiichi
[1
]
Sugimori, Yasufumi
[1
]
Kohama, Yoshinori
[1
]
Osada, Kenichi
[2
]
Irie, Naohiko
[2
]
Ishikuro, Hiroki
[1
]
Kuroda, Tadahiro
[1
]
机构:
[1] Keio Univ, Dept Elect & Elect Engn, Yokohama, Kanagawa 2238522, Japan
[2] Hitachi Ltd, Cent Res Lab, Tokyo 1858601, Japan
关键词:
CMOS integrated circuits;
high-speed interconnect;
low-power design;
SiP;
wireless interconnect;
D O I:
10.1109/TVLSI.2010.2056711
中图分类号:
TP3 [计算技术、计算机技术];
学科分类号:
0812 ;
摘要:
This paper discusses analysis and techniques formitigating interference of an inductive-coupling inter-chip link. Electromagnetic interference from power/signal lines and to SRAM circuits was simulated and measured. In order to verify the interference, test chips were designed and fabricated using 65-nm CMOS technology. The measurement results revealed that: 1) interference from power lines depends on the shape of the power lines; 2) interference from signal lines can be canceled by increasing transmitter power by only 9%; and 3) interference with SRAM circuits is less important than other issues under ordinary conditions. Based on the measurement results, interference mitigation techniques are proposed and investigated.
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页码:1902 / 1907
页数:6
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