Analysis and Techniques for Mitigating Interference From Power/Signal Lines and to SRAM Circuits in CMOS Inductive-Coupling Link for Low-Power 3-D System Integration

被引:11
|
作者
Niitsu, Kiichi [1 ]
Sugimori, Yasufumi [1 ]
Kohama, Yoshinori [1 ]
Osada, Kenichi [2 ]
Irie, Naohiko [2 ]
Ishikuro, Hiroki [1 ]
Kuroda, Tadahiro [1 ]
机构
[1] Keio Univ, Dept Elect & Elect Engn, Yokohama, Kanagawa 2238522, Japan
[2] Hitachi Ltd, Cent Res Lab, Tokyo 1858601, Japan
关键词
CMOS integrated circuits; high-speed interconnect; low-power design; SiP; wireless interconnect;
D O I
10.1109/TVLSI.2010.2056711
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper discusses analysis and techniques formitigating interference of an inductive-coupling inter-chip link. Electromagnetic interference from power/signal lines and to SRAM circuits was simulated and measured. In order to verify the interference, test chips were designed and fabricated using 65-nm CMOS technology. The measurement results revealed that: 1) interference from power lines depends on the shape of the power lines; 2) interference from signal lines can be canceled by increasing transmitter power by only 9%; and 3) interference with SRAM circuits is less important than other issues under ordinary conditions. Based on the measurement results, interference mitigation techniques are proposed and investigated.
引用
收藏
页码:1902 / 1907
页数:6
相关论文
共 2 条
  • [1] Modeling and Experimental Verification of Misalignment Tolerance in Inductive-Coupling Inter-Chip Link for Low-Power 3-D System Integration
    Niitsu, Kiichi
    Kohama, Yoshinori
    Sugimori, Yasufumi
    Kasuga, Kazutaka
    Osada, Kenichi
    Irie, Naohiko
    Ishikuro, Hiroki
    Kuroda, Tadahiro
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 18 (08) : 1238 - 1243
  • [2] A 65fJ/b Inter-Chip Inductive-Coupling Data Transceivers Using Charge-Recycling Technique for Low-Power Inter-Chip Communication in 3-D System Integration
    Niitsu, Kiichi
    Kawai, Shusuke
    Miura, Noriyuki
    Ishikuro, Hiroki
    Kuroda, Tadahiro
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2012, 20 (07) : 1285 - 1294