Ultrahigh vacuum magnetic force microscopy: domain imaging on in situ grown Fe(1 0 0) thin films

被引：8
|
作者：
Memmert, U [1 ]
Leinenbach, P
Losch, J
Hartmann, U
机构：
[1] Univ Saarland, Inst Phys Expt, D-66041 Saarbrucken, Germany
[2] Forschungszentrum Julich, Inst Thin Film & Ion Technol, D-52425 Julich, Germany
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1998年 / 190卷 / 1-2期
关键词：
domain structure; magnetic force microscopy;
D O I：
10.1016/S0304-8853(98)00269-8
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The design of an ultrahigh vacuum (UHV) magnetic force microscope (MFM) is described. The instrument was applied to investigate the magnetic structure of 10-80 nm thick Fe(1 0 0) films grown in situ in UHV on Ag(1 0 0) thin film substrates. The domain structure: consists mainly of 90 degrees domain walls while only a minority of 180 degrees walls was found, The wall profiles are found to be of Neel type for 10 nm films and of asymmetric Bloch type for 80 nm films. (C) 1998 Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码：124 / 129
页数：6
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