Nanopatterning of oxide 2-dimensional electron systems using low-temperature ion milling

被引:5
|
作者
D'Antuono, M. [1 ,2 ]
Kalaboukhov, A. [3 ]
Caruso, R. [1 ,2 ,4 ]
Wissberg, S. [5 ,6 ]
Sobelman, S. Weitz [5 ,6 ]
Kalisky, B. [5 ,6 ]
Ausanio, G. [1 ,2 ]
Salluzzo, M. [2 ]
Stornaiuolo, D. [1 ,2 ]
机构
[1] Univ Naples Federico II, Naples, Italy
[2] CNR, SPIN, Naples, Italy
[3] Chalmers Univ Technol, Dept Microtechnol & Nanosci MC2, Gothenburg, Sweden
[4] Brookhaven Natl Lab, Condensed Matter Phys & Mat Sci Dept, Bldg 480,POB 5000, Upton, NY 11973 USA
[5] Bar Ilan Univ, Dept Phys, Ramat Gan, Israel
[6] Bar Ilan Univ, Inst Nanotechnol & Adv Mat, Ramat Gan, Israel
基金
欧洲研究理事会; 欧盟地平线“2020”;
关键词
oxide; 2DES; nanodevices; oxide field effect devices;
D O I
10.1088/1361-6528/ac385e
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We present a 'top-down' patterning technique based on ion milling performed at low-temperature, for the realization of oxide two-dimensional electron system devices with dimensions down to 160 nm. Using electrical transport and scanning Superconducting QUantum Interference Device measurements we demonstrate that the low-temperature ion milling process does not damage the 2DES properties nor creates oxygen vacancies-related conducting paths in the STO substrate. As opposed to other procedures used to realize oxide 2DES devices, the one we propose gives lateral access to the 2DES along the in-plane directions, finally opening the way to coupling with other materials, including superconductors.
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页数:7
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