Atomic resolution noncontact atomic force/scanning tunneling microscopy using a 1 MHz quartz resonator

被引：39

作者：

Heike, S ^{[1
]}

Hashizume, T ^{[1
]}

机构：

[1] Hitachi Ltd, Adv Res Lab, Hatoyama, Saitama 3500395, Japan

来源：

APPLIED PHYSICS LETTERS | 2003年 / 83卷 / 17期

关键词：

D O I：

10.1063/1.1623012

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A 1 MHz quartz length extension resonator is used as a force sensor for a noncontact atomic force/scanning tunneling microscope (AFM/STM). A tungsten probe tip glued onto the end of the quartz rod enables the detection of tunneling currents for STM observation. Au surface was observed in both AFM and STM modes. The resolution difference is discussed in terms of the insulating oxide layer on the tip. We also demonstrate the AFM/STM observation of the Si(111)-7x7 surface with atomic resolution in an ultrahigh vacuum. (C) 2003 American Institute of Physics.

引用

页码：3620 / 3622

页数：3

共 50 条

[21] Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy
Ozer, H. Ozgur
ULTRAMICROSCOPY, 2019, 196 : 54 - 57
[22] A noncontact atomic force microscope in air using a quartz resonator and the FM detection method
Nishi, R.
Houda, I.
Kitano, K.
Sugawara, Y.
Morita, S.
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 72 (Suppl 1): : S93 - S95
[23] A noncontact atomic force microscope in air using a quartz resonator and the FM detection method
R. Nishi
I. Houda
K. Kitano
Y. Sugawara
S. Morita
Applied Physics A, 2001, 72 : S93 - S95
[24] MEDIUM-RESOLUTION AND LOW-RESOLUTION SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY
WALLS, MG
ANNALES DE CHIMIE-SCIENCE DES MATERIAUX, 1992, 17 (3-4): : 191 - 203
[25] Noncontact atomic force microscopy
Schwarz, Udo D.
BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2012, 3 : 172 - 173
[26] True atomic resolution imaging on semiconductor surfaces with noncontact atomic force microscopy
Sugawara, Y
Ueyama, H
Uchihashi, T
Ohta, M
Yanase, Y
Shigematsu, T
Suzuki, M
Morita, S
DEFECTS IN ELECTRONIC MATERIALS II, 1997, 442 : 15 - 23
[27] Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers
Sawada, Daisuke
Hirai, Akira
Sugimoto, Yoshiaki
Abe, Masayuki
Morita, Seizo
MATERIALS TRANSACTIONS, 2009, 50 (05) : 940 - 942
[28] GaN nanowires as probes for high resolution atomic force and scanning tunneling microscopy
Yngman, S.
Lenrick, F.
Liu, Y. -P.
Ren, Z.
Khalilian, M.
Ohlsson, B. J.
Hessman, D.
Samuelson, L.
Timm, R.
Mikkelsen, A.
REVIEW OF SCIENTIFIC INSTRUMENTS, 2019, 90 (10):
[29] Atomic Force Microscopy and Scanning Tunneling Microscopy of Aluminum Nanoislands
Nedilko, S.
Prorok, V
Rozouvan, S.
NANO HYBRIDS AND COMPOSITES, 2012, 2 : 13 - 24
[30] VIEWING MOLECULES WITH SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY
EDSTROM, RD
YANG, XR
LEE, G
EVANS, DF
FASEB JOURNAL, 1990, 4 (13): : 3144 - 3151

← 1 2 3 4 5 →