An X-ray Fourier line shape analysis in cold-worked hexagonal titanium base alloys

被引：12

作者：

Sen, R ^{[1
]}

Chattopadhyay, SK

Chatterjee, SK

机构：

[1] Bidhan Chandra Inst, Durgapur 713205, India

[2] Reg Engn Coll, Dept Phys, Durgapur 713209, India

[3] Reg Engn Coll, Dept Engn Met, Durgapur 713209, India

来源：

METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE | 1998年 / 29卷 / 10期

关键词：

D O I：

10.1007/s11661-998-0236-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Titanium-base aluminum and titanium-base zirconium, two of the numerous titanium-base alloys being used widely in the aviation industry, were characterized. A number of X-ray diffraction profiles belonging to both fault-affected (H - K = 3N ± 1) and fault-unaffected (H - K = 3N) reflections were recorded by a SIEMENS* Kristolloflex-4 diffractometer using Cu Kα radiation. By analyzing the resulting profiles, the microstructural parameters were defined.

引用

页码：2639 / 2642

页数：4

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